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Electrically alterable field effect transistor amplifier configuration
The present invention eliminates the problem of the prior art by providing a single configuration incorporating electrically alterable elements for selecting the output ...
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Low power liquid crystal display driver circuit
In accordance with this invention, a low power display circuit is provided. This circuit includes an input circuit to receive data to be displayed. The input circuit is ...
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Wire harness
We claim: 1. A wire harness comprising: a plurality of connecting wires with each said wire being provided with terminals on each end and wherein said connecting wires ...
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Defined coverage loudspeaker horn
A loudspeaker horn for directing sound from a driver having a principal axis of propagation to a target area having a plurality of portions located different distances ...
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Sound reinforcement enclosure employing cone loudspeaker with annular central loading member and coaxially mounted compression driver
A sound reinforcement enclosure is provided with at least one cone-type loudspeaker operating into a channel extending forwardly towards an outlet to free air. At least ...
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Muffler
What is claimed is: 1. A muffler comprising: an upper case provided at the opposite ends with semi-cylindrical inlet and outlet sections respectively and having an ...
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Muffler
It is an object of the present invention to provide a muffler which can not only damp the combustion and exhaust sounds of the internal combustion engine, but also damp ...
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Bearing body for motorcycle
I claim: 1. In a motorcycle: a support body having a longitudinal median plane; an oscillating arm fulcrummed to said body for pivoting movement about an axis transverse ...
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Protection by underwater sound waves
One object of the invention is to produce a field or area traversed by sound waves and including a receiving device which is activated by the sound waves and which will ...
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Parametric tester for semiconductor devices
The present invention comprises a tester for conducting parametric tests on a digital semiconductor device through its external leads. Tests are conducted by applying a ...
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