Method of automatically calibrating a microprocessor controlled digital multimeter |
| It is a general object of this invention to provide an improved multimeter. It is a more specific ... |
|
Reversible thermal vest garment |
| What I claim is: 1. An insulating garment comprising a vest having spaced inner and outer fabric ... |
|
Electronic musical instrument |
| It is accordingly a primary object of the present invention to provide an electronic musical ... |
|
Piezo electric transducer for measuring instantaneous vibration velocity |
| According to the present invention a high-sensitivity piezo electric crystal stack with interposed ... |
|
Waveform timing alignment system for digital oscilloscopes |
| An object of this invention is, therefore, to provide a system for achieving temporal alignment of ... |
|
Apparatus for generating and cooling synthesis gas |
| I claim: 1. A synthesis gas generation apparatus including a vertically extending synthesis gas ... |
|
Method and apparatus for treating waste containing organic contaminants |
| What is claimed is: 1. A countercurrent, direct fired rotary kiln for the decontamination for a ... |
|
Work-clamping unit for use in machine tools |
| OF THE INVENTION Referring to FIGS. 1 and 2, a drilling machine (M) includes a horizontal table 1 ... |
|
Method of transfer function generation and active noise cancellation in a vibrating system |
| I claim: 1. A method for the active cancellation of an incident vibration field (N(i.omega.)) ... |
|
Method and apparatus for monitoring a pulse-code modulated data transmission |
| OF THE DRAWINGS The invention will now be described, by way of example, with reference to FIGS. 1 ... |
|
|
Methods for producing compound semiconductor devices
| Details |
Inventors: Miyazawa, Seiichi; Mizutani, Natsuhiko;
Assignee: Canon Kabushiki Kaisha (Tokyo, JP)
Primary Examiner: Kunemund; Robert
Assistant Examiner:
Attorney, Agent or Firm: Fitzpatrick, Cella, Harper & Scinto
In a method for producing a compound semiconductor device such as laser diodes, FET and HEMT, compound semiconductor is grown at a substrate temperature not greater than 500.degree. C. to form a semiconductor layer on a substrate of the semiconductor device. Then, an appropriate treatment, such as heat-treatment in reducing atmosphere, current flow treatment and hydrogen plasma treatment, is conducted to reduce crystal defects in the semiconductor layer attributable to the crystal growth at the low substrate temperature not greater than 500.degree. C. |
|
DETAILED DESCRIPTION It is an object of the present invention to provide a method for producing compound semiconductor devices, whose crystallinity is improved, in order that high quality crystal layers can be fabricated on a substrate made up of material different therefrom, at low temperatures, so that inter-diffusions are eliminated and that stresses due to the difference in thermal expansion coefficient are suppressed. It is another object of the present invention to provide a method for producing semiconductor devices, whose crystallinity and boundary-plane flatness are improved, at low growth temperatures. The present invention is generally directed to a method of fabricating a semiconductor device which includes a step of growing a compound semiconductor at a substrate temperature not greater than 500. degree. C. to form a semiconductor layer on a substrate of the devic, and a step of reducing crystal defects of the semiconductor layer attributable to the growth at the low substrate temperature not greater than 500. degree. C. According to one aspect of the present invention, a method for producing a compound semiconductor device is characterized in that a compound semiconductor containing at least, for example, III and V group elements is grown by the vacuum deposition at a substrate temperature not greater than 500. degree. C. to form semiconductor layers of the semiconductor device, and that the thus fabricated semiconductor device is heat-treated in reducing atmosphere containing hydrogen or the like. According to another aspect of the present invention, a method for producing a compound semiconductor device is characterized in that a crystal layer of the device is formed on a substrate with materials belonging to at least two different groups of the periodic law table, at a crystal growth temperature not greater than or below 500. degree. C. , and that a current is caused to flow into the thus formed crystal layer. According to the present invention, a substrate temperature at the time of growth of compound semiconductor hereto-interface is set to a value not greater than 500
|
|