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| Pouches |
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| Disposable cooking bags |
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| High speed batch mixer |
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| Continuous compartmented mixer |
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| Bakeware with surface texture |
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| Solid and liquid separator with a liquid filter |
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Method for calibrating scintillation crystal
| Details |
Inventors: Outhwaite, Stephen J.;
Assignee: Fairchild Weston Systems, Inc. (Archbald, PA)
Primary Examiner: Smith; Alfred E.
Assistant Examiner: Fields; Carolyn E.
Attorney, Agent or Firm: Gaudier; Dale
An X-ray or gamma-ray scintillation crystal used in a radiation-type thickness gauge is calibrated by irradiating the scintillation crystal at a high intensity and then abruptly lowering the intensity to a low level (e.g. 1/100 the high intensity level). The nonlinear response of the crystal due to after-glow and hysteresis is periodically measured and correlated with an ideal (e.g. linear) response function. The radiation level is then increased to its former high intensity and periodic measurements are made of the nonlinear response of the crystal. The correlated values are stored, for example, in a computer memory as a table of time dependent correction factors. The stored values are used to correlate a measured signal from the scintillation crystal regardless of the radiation intensity and the hysteresis of the crystal and without having to wait for the "afterglow" to disappear in order to make subsequent measurements. |
|
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT FIG.
1 shows a typical radiation gauging system suitable for practicing the method of the present invention.
Such systems are well known, as evidenced by the aforementioned U.
S.
Pat.
Nos.
4,009,376 and 4,119,846.
Such a gauging system is made by Weston Controls, Div.
of Fairchild Weston Systems, Inc.
, Archbald, Pa.
, and is sold as its XACTRAY.
RTM.
2000 non-contact gauging system.
This gauging system includes, among other things, a source of penetrating electromagnetic radiation 1 (such as X-ray or gamma ray radiation), a set of calibration standards 3, a scintillation crystal 5 (formed from a radiation responsive material such as NaI or CsI for receiving a beam of radiation 7 formed by source 1, and a photomultiplier or photodiode 9 sensitive to the scintillations of crystal 5.
The output of photomultiplier 9 is amplified by amplifier 13 to produce an output voltage V.
sub.
o which is generally proportional to the amount of light emitted from crystal 5.
This, in turn, is generally proportional to the amount or intensity of radiation 7 impinging on crystal 5.
Together, crystal 5, photomultiplier 9, and amplifier 13 form a detection device or scintillation camera 14 responsive to radiation from source 1.
As will be appreciated, the radiation intensity level on crystal 5 is a function of the distance between source 1 and crystal 5, the medium through which the beam 7 travels (air, vacuum, etc.
), and the density and thickness of any unknown sample 11 (shown in dashed outline in FIG.
1).
Since the distance between source 1 and crystal 5 and the density of the medium therebetween is known, and the density of the sample to be measured is usually also known, then after initial thickness calibration steps are performed (using calibrated thickness standards 3) as detailed in the aforementioned U.
S.
patents, the output of photomultiplier 9 will be a linear function of the thickness of sample 11.
The photomultiplier output is applied to amplifier 13 to produce an amplified signal V
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