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Bipolar transistor with particular base structure
The present invention was made in order to solve the foregoing problems, and its object is to reduce the parasitic capacitance between the base and the collector in the ...
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Method and apparatus for extracting parameters for an electrical structure
OF THE PREFERRED EMBODIMENT The present invention provides for parameter extraction for an electrical structure. This parameter extraction is based on a definition of ...
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Automatic performing system capable of detection and correction of errors in performance information
Wherefore, an object of this invention is to provide an automatic performing system in which an error in the transmission of performance information is corrected by ...
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System for determining the operations of an integrated circuit and processor for use therein
A first embodiment of the present invention is shown in FIG. 2. The system comprises a translator 2 which receives information supplied by the manufacturer concerning ...
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Logic equation fault analyzer
What is claimed is: 1. A computer system including: A) a plurality of system modules, each of said system modules including means for sensing the occurrence of a ...
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Methods and test platforms for developing an application-specific integrated circuit
What is claimed is: 1. A method for developing a programmed ASIC integrated circuit which includes a signal processor core, a RAM memory and a ROM memory for management ...
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Method for testing reflection LCD projector and display panel pixel area thereof
Accordingly, it is the object of the present invention to provide a highly reliable and efficient testing method for a CMOS silicon wafer LCD in a reflection-type LCD ...
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Audio sample tracker
Briefly, and in general terms, the present invention provides a system for minimizing the error between a future state of the system after a delay and the predicted ...
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Optical proximity correction system
OF THE INVENTION Referring now to FIG. 14, there is illustrated a simplified procedure for mask OPC according to a first embodiment of the present invention. When ...
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Modifying a design layer of an integrated circuit using overlying and underlying design layers
The problems outlined above are in large part solved by the proximity correction technique hereof in which a design layer of an integrated circuit is altered by spatial ...
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