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Systems and methods for testing and manufacturing large-scale, transistor-based, nonlinear circuits
| Details |
Inventors: Melville, Robert C.; Roychowdhury, Jaijeet;
Assignee: Lucent Technologies, Inc. (Murray Hill, NJ)
Primary Examiner: Teska; Kevin J.
Assistant Examiner: Frejd; Russell W.
Attorney, Agent or Firm:
Systems and methods that include a homotopy technique are employed to find a DC operating point of large-scale, transistor-based, nonlinear circuits?, allowing such circuits to be designed, tested and manufactured!. The systems and methods use arclength continuation together with a new two-phase embedding of .lambda. into equations describing the circuits. One of the systems includes: (1) a DC operating point determination circuit (or determinor) that receives parameters relating to the nonlinear circuit into a globally-convergent model thereof and embeds therein at least two arclength continuation parameters relating to driving-point and transfer characteristics of a transistor in the nonlinear circuit?, the DC operating point determination circuit capable of adjusting the arclength continuation parameters to cause the globally-convergent model to converge on a DC operating point for the nonlinear circuit! and (2) an analysis circuit, coupled to the DC operating point determination circuit, that employs the DC operating point to determine an overall response characteristic of the nonlinear circuit |
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DETAILED DESCRIPTION To address the above-discussed deficiencies of the prior art, the present invention provides systems and methods for testing and manufacturing a transistor-based nonlinear circuit.
One of the systems includes: (1) a DC operating point determination circuit (or determinor) that receives parameters relating to the nonlinear circuit into a globally-convergent model thereof and embeds therein at least two arclength continuation parameters relating to driving-point and transfer characteristics of a transistor in the nonlinear circuit, the DC operating point determination circuit capable of adjusting the arclength continuation parameters to cause the globally-convergent model to converge on a DC operating point for the nonlinear circuit and (2) an analysis circuit, coupled to the DC operating point determination circuit, that employs the DC operating point to determine an overall response characteristic of the nonlinear circuit.
The present invention therefore introduces a significant improvement to globally-convergent nonlinear circuit models, such as those based on homotopy, by requiring at least two arclength continuation parameters to be embedded in such models.
The new embedding circumvents inefficiencies and numerical failures that limit the applicability of prior art, simpler embeddings, allowing convergence reliably to occur on virtually all practical circuits.
As stated above, the arclength continuation parameters relate to both driving-point and transfer characteristics of a transistor in the nonlinear circuit.
Once found, the DC operating point of the nonlinear circuit forms the basis of subsequent characteristic determination or testing.
The present invention can be embodied in hardware or software, as appropriate to the application thereof.
In one embodiment of the present invention, the globally-convergent model is a homotopic model.
The present invention is not limited to homotopy, however.
Later-discovered globally-convergent models may be embedded with multiple arclength continuation parameters to advantage
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