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Details
Inventors: Minneman, Michael; Reindel, Kenneth A.; Banaska, John G.; Bish, Gary K.; Creque, Andy J.; Atwell, Michael;
Assignee: Keithley Instruments, Inc. (Cleveland, OH)
Primary Examiner: Strecker; Gerard R.
Assistant Examiner: Do; Diep
Attorney, Agent or Firm: Pearne, Gordon, McCoy & Granger

A current in a circuit is measured without breaking the circuit. A relatively low resistance element in the circuit such as a component lead is chosen. A current is forced through the element and the voltage drop measured. Another current is forced through the element and the voltage drop measured. The values of these currents and voltages are used to determine the original current in the circuit.

DETAILED DESCRIPTION The present invention provides a method for the accurate and reliable measurement of currents in a circuit without breaking the circuit to insert a measuring device.
The method for measuring current I.
sub.
0 in a circuit includes selecting an element in the circuit having a low resistance with respect to the remainder of the circuit, This element remains connected in the circuit.
A current source is connected in parallel with the element.
The current source has an output current and a current control input for controlling the output current.
A voltage measuring device is connected in parallel with both the element and the current source.
The voltage measuring device has a voltage measurement output for providing a voltage measurement across the element and a voltage measurement control input for controlling the voltage measurement process.
A control device is connected to the current control input and the voltage measurement control input.
A calculation device having a calculation control input is connected to the control device.
A first current I.
sub.
1 is driven through the element with the current source and a first voltage V.
sub.
1 across the element is measured with the measuring device, all in response to the control device.
The first current is at or near zero.
A second current I.
sub.
2 is driven through the element with the current source and a second voltage V.
sub.
2 across the element is measured with the measuring device, all in response to the control device.
The second current is greater than the first current.
A value for the current I.
sub.
0 is calculated with the calculation device in response to the control device according to ##EQU1## The calculated value is provided to a user or to an automated test system in response to the control device.



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