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Methods and apparatus for caching a location index in a data storage system
Aspects of the present invention relate to improved techniques for accessing content in a storage system. In accordance with one embodiment of the present invention, ...
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Method and apparatus for correcting data errors
Broadly speaking, the present invention relates to an error correcting method and apparatus which shortens the time needed to perform error correction using a buffer ...
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Method and apparatus for enhancing data rate in processing ECC product-coded data arrays in DVD storage subsystems and the like
What is claimed is: 1. A machine-implementable method for enhancing the data transfer rate in an arrangement formed by an ECC processor coupling a first memory, said ...
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Data processing method and apparatus, recording medium, reproducing method and apparatus using the same method
OF THE INVENTION Hereinafter, referring to the accompanying drawings, embodiments of the present invention will be explained. In a structure of an error-correcting ...
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Method for testing integrated circuits having a grid-based, "cross-check" t e
The present invention is a new test structure which allows up to 100 percent electrical testing of Very Large Scale Integrated Circuits by the addition of an array of ...
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Serial scan chain architecture for a data processing system and method of operation
What is claimed is: 1. A data processor having a scan chain architecture, the scan chain architecture comprising: a plurality of scan chains wherein each scan chain in ...
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Hierarchically managed boundary-scan testable module and method
OF THE DRAWINGS FIG. 1 is a block diagram of electronic system 10 that accommodates JTAG testing through the use of a hierarchically managed testable module 12. System 1...
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Multiple BIST controllers for testing multiple embedded memory arrays
The present invention generally relates to various models representing at least a portion of a semiconductor device and various semiconductor devices. In accordance with ...
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Boundary scan latch configuration for generalized scan designs
The present invention relates generally to a boundary design of a chip. More particularly, the present invention relates to a boundary scan latch configuration for ...
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RAM memory circuit having a plurality of banks and an auxiliary device for testing
One aspect of the invention is directed to designing a RAM memory circuit provided with a plurality of memory banks such that the circuit may be tested in a shorter time ...
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