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Home Fault Detection Method-and-apparatus-for-automatically-correcting-errors-detected-in-a-memory-subsystem

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Details
Inventors: Von Bokern, Vincent; Bogin, Zohar; Freker, David;
Assignee: Intel Corporation (Santa Clara, CA)
Primary Examiner: Beausoliel, Jr.; Robert W.
Assistant Examiner: Elmore; Stephen C.
Attorney, Agent or Firm: Blakely, Sokoloff, Taylor & Zafman LLP

An apparatus and method for correcting corrupted data. Access logic accesses a memory. Error detection logic generates an error signal for each data value output by the memory to indicate whether the data value has a correctable error. Correction logic requests the access logic to write to the memory a corrected version of each data value indicated by the error signal to have a correctable error.

DETAILED DESCRIPTION An apparatus and method for correcting corrupted data are disclosed.
Access logic is provided to access a memory.
For each data value output by the memory, error detection logic generates an error signal indicating whether the data value has a correctable error.
For each data value indicated by the error signal to have a correctable error, correction logic requests the access logic to write a corrected version of the data value to the memory.


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