Home | Links | Contact Us | More About Intellectual Property | Bookmark
Search patents:
Home Fault Detection Optimizing-repeaters-positioning-along-interconnects

 Cell-based noise characterization and evaluation
OF THE INVENTION Aspects of the present invention include methods and apparatus for designing an ...


 Adaptive test program generation
It is an advantage of some aspects of the present invention that an event handling mechanism is ...


 Hybrid interface for packet data switching
The invention allows parallel transfer of data without the limitation imposed by the phase ...


 System and method for approximating the coupling voltage noise on a node
OF THE PREFERRED EMBODIMENT Having summarized various aspects of the present invention, reference ...


 Method and system for testing interconnected integrated circuits
The problems identified above are addressed by a system, device, and method for dynamically testing ...


 Pulse code sequence analyzer
It is an object of the invention to provide pulse code sequence apparatus and a method for ...


 System and method for efficient analysis of transmission lines
OF PREFERRED EMBODIMENTS The present invention provides systems and methods for analyzing ...


 Optical calculating apparatus
It is an object of the invention to provide an optical calculating apparatus which can eliminate ...


 High frequency source having heterodyned laser oscillators injection-locked to a mode-locked laser
OF THE PREFERRED EMBODIMENTS The invention is based on achieving a high-degree of correlation ...


 Light modulation system including a superconductive plate assembly for use in a data transmission scheme and method
The present invention provides an apparatus and method for the modulation of light. A layer of ...


 Optimizing repeaters positioning along interconnects

Details
Inventors: Muddu, Sudhakar; Sarto, Egino;
Assignee: Silicone Graphics Inc. (Mountain View, CA)
Primary Examiner: Smith; Matthew
Assistant Examiner: Kik; Phallaka
Attorney, Agent or Firm: Squire, Sanders & Dempsey L.L.P.

An aspect of interconnect design for optimizing delay characteristics of interconnects. The interconnect design for delay characteristics optimization is performed using a method for optimizing repeaters positioning along interconnects. The method includes inserting repeaters in positions along a first interconnect at predetermined intervals that are related to signals transition time. The method further includes inserting repeaters in positions along a second interconnect at the predetermined intervals, the second interconnect being a neighbor of the first interconnect. The positions of repeaters along the second interconnect are offset, by a predetermined length, relative to the positions of repeaters along the first interconnect so that the repeaters positions along the second interconnect are shifted relative to the repeaters positions along the first interconnect. In one embodiment, the predetermined length is half (0.5) of the predetermined interval such that repeaters are shifted by half, wherein the interconnect delay that corresponds to the offsetting by half of the predetermined interval minimizes the interconnect delay under worst case conditions. The repeaters are inserted to decrease interconnect delay and make the interconnect delay scale linearly with an interconnect length.

DETAILED DESCRIPTION A preferred embodiment of the present invention provides an aspect of interconnect design for optimizing delay characteristics of interconnects.
The preferred embodiment further provides a method for analyzing the delay characteristics of interconnects for verifying interconnect design results.
Interconnect delay characteristics are improved by inserting repeaters at predetermined intervals along interconnects in a metal layer.
The metal layer is any one of a plurality of metal layers in a semiconductor device that embodies an integrated circuit (IC).
Typically, each interconnect in the metal layer has at least one neighboring interconnect.
The position of repeaters along every other interconnect in the metal layer is shifted relative to the position of repeaters along their neighboring interconnect(s).
To achieve improved interconnect delay characteristics, the positioning of repeaters along interconnects is optimized by adjusting the position shift based on factors such as repeaters physical characteristics and signal waveforms.
In accordance with the purpose of the invention, as embodied and broadly described herein, the invention relates to a method for optimizing repeaters positioning along interconnects.
Specifically, the method includes inserting repeaters in positions along a first interconnect at predetermined intervals that are related to signal transition times.
The method further includes inserting repeaters in positions along a second interconnect at the predetermined intervals, the second interconnect being a neighbor of the first interconnect.
The positions along the second interconnect are offset, by a predetermined length, relative to the positions along the first interconnect so that the repeaters along the second interconnect are shifted relative to the repeaters along the first interconnect.
The predetermined length is half (0.
5) of the predetermined intervals such that repeaters are phase shifted by half, wherein the interconnect delay that corresponds to the offsetting by half of the predetermined interval minimizes the interconnect delay under worst case conditions



Related patents
  Method and apparatus for placing repeaters in a network of an integrated circuit
OF THE PREFERRED EMBODIMENT(S) FIG. 1 is a schematic diagram of a network or net 100 that is used to illustrate repeater insertion in accordance with the present ...
  Parasitic element extraction apparatus
It is an object of the present invention to solve at least the problems in the conventional technology. The parasitic element extraction apparatus extracts parasitic ...
  Voltage controlled oscillator including voltage controlled delay circuit with power supply noise isolation
Accordingly, one object of the present invention is a VCO which is less sensitive than prior art VCOs to power supply noise. Another object of the present invention is a ...
  Bist architecture for measurement of integrated circuit delays
The IC to be tested is provided with, in one embodiment, a two-wire test bus, which passes near each circuit node of interest. Each node which is an input to a delay ...
  Oscillator for measuring on-chip delays
FIG. 2 is a schematic diagram of an oscillator 200 configured, in accordance with the invention, to include a pair of similar test circuits 210A and 210B. Test circuits ...
  Method and system for measuring signal propagation delays using ring oscillators
FIG. 2 is a schematic diagram of a conventional tester 200 connected to an FPGA 210 that has been configured to implement an oscillator and to determine the period and ...
  Monitor TEG test circuit
OF THE PREFERRED EMBODIMENTS Referring now to the drawings, wherein like reference numerals designate identical or corresponding parts throughout the several views, and ...
  System, IC chip, on-chip test structure, and corresponding method for modeling one or more target interconnect capacitances
In summary, the present invention comprises a system, an IC chip, a test structure formed on the IC chip, and a corresponding method for modeling one or more target ...
  IC substrate noise modeling including extracted capacitance for improved accuracy
An invention is described herein which provides methods and apparatus for modeling noise present in an integrated circuit substrate. This is accomplished by obtaining a ...
  Method for performing coupling analysis
Deterministic evaluation of coupling noise voltage is a function of many physical and electrical parameters such as wiring level, widths, spacing, net topologies, drv ...

0.014

Archive: All patents - Links

Copyright (c)2006 Eipa-patents.org - All rights reserved