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Details
Inventors: Kirihata, Toshiaki; Watanabe, Yohji;
Assignee: International Business Machines Corporation (Armonk, NY)
Primary Examiner: Nelms; David C.
Assistant Examiner: Niranjan; F.
Attorney, Agent or Firm: Peterson, Jr.; Charles W.

A wide Input/Output (I/O) Random Access Memory (RAM) with more efficient redundancy. The RAM array may be divided into individual units. Each unit is further divided into subarray blocks (blocks of subarrays). Each subarray or segment is organized by one and includes one spare column and may include spare word lines. When a block is accessed, only half of the segments are accessed. Whenever a segment is accessed, the segment's spare column is not. The spare columns from the unaccessed half block are available for repairing defective columns in the accessed half block. Data from columns in the accessed half and spare columns in the unaccessed half are transferred to Local Data Lines (LDLs) and from LDLs to Master Data Lines (MDLs). Valid data from accessed column lines and from selected spare lines are provided on the MDLS to second sense amplifiers. Defective columns are electrically replaced with spares after the second stage amplifiers. Thus, all of the spare columns in each half of each subarray block are available to replace an equal number of failed columns at any location in any segment in the other half block.

DETAILED DESCRIPTION The present invention is a wide I/O Random Access Memory (RAM) and the architecture and redundancy scheme, therefor.
If the RAM is large, it is divided into units.
For each unit, or for smaller RAMs, the memory is further sub-divided into blocks.
The blocks are subdivided into segments.
The segments are arranged in rows and columns and each segment includes at least one spare column.
Optionally, the segments may also include spare rows.
Row selection is responsive to a row address and is common for all segments in a block.
During any array access, only half of the segments in a block are accessed.
The redundant columns may be selected from the segments in the unaccessed half to replace a defective column in one or more accessed segments.
Selected redundant columns are swapped for defective columns late in the cycle, eliminating the need for a redundancy decode delay in the access.



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