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Semiconductor integrated circuit device, manufacturing method thereof, and driving method for the same
| Details |
Inventors: Kubo, Kazuaki; Endo, Youichi; Miyagi, Masanori;
Assignee: Seiko Instruments Inc. (JP)
Primary Examiner: Hoo; Do Hyun
Assistant Examiner:
Attorney, Agent or Firm: Adams & Wilks
An EEPROM capable of arbitrarily setting a write time includes a timer circuit connected to a trimming circuit for determining a write time, and a trimming redundant memory array used for storing trimming data to be supplied to the trimming circuit in accordance with a predetermined write time so that the write time can be arbitrarily set. A series of calibration operations are performed such that the trimming data is read from the trimming redundant memory and supplied to the trimming circuit and the timer circuit is controlled so as to set the write time to a desired value. The latter operation is carried out in parallel to a normal write operation. Accordingly, neither special instructions nor an additional time period are required to perform the calibration operation, and a stable operation can be achieved in less time. |
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DETAILED DESCRIPTION To solve the above-described problems, the present invention employs the below-mentioned means.
As a first means, means for storing therein trimming data, means for reading the trimming data, and means (which will be referred to as a "trimming circuit" hereinafter) capable of varying an operation condition of a semiconductor integrated circuit device based on the trimming data are mounted on the semiconductor integrated circuit device.
The trimming circuit is forcibly set to an arbitrary initial condition, and at the same time, or thereafter, the trimming data is written into the means for storing therein the trimming data.
Thus, the semiconductor integrated circuit is so arranged that the trimming data is subsequently read from the means for storing therein the trimming data by way of the means for reading the trimming data, and the semiconductor integrated circuit can be operated under a desirable operation condition by the trimming circuit driven by the trimming data.
Also, such a method for manufacturing a semiconductor integrated circuit device is employed in which arbitrary trimming data is forcibly set into the trimming circuit of the semiconductor integrated circuit device at the beginning as an initial condition.
As a second means, such a semiconductor integrated circuit device is constructed as follows: In the semiconductor integrated circuit device according to the first means, when a specific signal is inputted into a specific terminal of the semiconductor integrated circuit device, which may fill the role of, for example, a test terminal, the trimming circuit is forcibly set to an arbitrary initial condition, and at the same time, or thereafter, the trimming data is written into the means for storing therein the trimming data.
Subsequently, the trimming data is read from the storage means for storing therein the trimming data by the means for reading the trimming data, and furthermore the semiconductor integrated circuit device is operated under desired operation condition by the trimming circuit driven by the read trimming data
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