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 Semiconductor memory device having redundant circuit

Details
Inventors: Takeuchi, Hideki; Hayakawa, Shigeyuki; Yabe, Tomoaki;
Assignee: Kabushiki Kaisha Toshiba (Kawasaki, JP)
Primary Examiner: LaRoche; Eugene R.
Assistant Examiner: Nguyen; Tan
Attorney, Agent or Firm: Spensley Horn Jubas & Lubitz

An internal row address signal output from an address buffer is supplied to first and second row partial decoders. A programming circuit is programmed to store information indicating whether the redundant function is used or not and a defective address corresponding to a defective main word line or defective memory cell in a main memory cell array. The defective row address and the internal row adders signal are compared with each other by the programming circuit and the spare decoder, a control signal corresponding to the coincidence/non-coincidence of the compared row addresses is output, and a partial decode signal of the internal row address signal is output when the compared row addresses coincide with each other. The second partial decoder receives a control signal output from the spare decoder and outputs a partial decode signal of the internal row address signal when the control signal indicates the non-coincidence of the compared row addresses. The partial decode signals output from the first and second row partial decoders are supplied to the main row decoder which in turn selects one of main word lines in the main memory cell array. The partial decode signal output from the spare decoder is supplied to a spare row decoder which in turn selects one of spare word lines in a spare memory cell array.

DETAILED DESCRIPTION Accordingly, a first object of this invention is to provide a semiconductor memory device capable of enhancing the access speed.
A second object of this invention is to provide a semiconductor memory device capable of effecting the stable operation.
A third object of this invention is to provide a semiconductor memory device whose current consumption is small.
The above first to third objects of this invention can be attained by a semiconductor memory device comprising a main memory cell array having memory cells arranged in a matrix form; main word lines each connected to those of the memory cells of the main memory cell array which are arranged on a corresponding row; a spare memory cell array having spare memory cells arranged in a matrix form, the spare memory cells of the same number as the memory cells connected to one main word line being arranged on each row; spare word lines each connected to those of the spare memory cells of the spare memory cell array which are arranged on a corresponding row; a spare decoder having a defective row address programmed therein when at least one of the memory cells of the main memory cell array or at least one of the main word lines becomes defective, comparing the programmed defective row address with an input row address signal to check whether or not the compared addresses coincide with each other, outputting a control signal corresponding to the coincidence/non-coincidence of the compared row addresses, and outputting a first partial decode signal of the input address signal when the compared addresses coincide with each other; a spare row decoder for receiving the first partial decode signal and selectively driving the spare word lines; a row partial decoder for receiving the input row address signal and the control signal and outputting a second partial decode signal of the input row address signal when the control signal indicates the non-coincidence of the addresses; and a main row decoder for receiving the second partial decode output and selectively driving the main word lines



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