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Soft error detection in high speed microprocessors
| Details |
Inventors: Jordan, Paul J.; Klim, Peter J.;
Assignee: International Business Machines Corporation (Armonk, NY)
Primary Examiner: Baderman; Scott
Assistant Examiner:
Attorney, Agent or Firm: England; Anthony V. S., Salys; Casimer K.
Aspects for soft error detection for a superscalar microprocessor are described. The aspects include a first pipeline, the first pipeline including a first arithmetic logic unit, ALU, comparator and a first general purpose register, GPR, for storing first data, and a second pipeline, the second pipeline including a second GPR and a second ALU comparator, the second GPR for storing second data, the second data being a copy of the first data. A detection system utilizes one of the first and second ALU comparators to perform a comparison of the second data with the first data during an idle state of the first and second pipelines. |
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DETAILED DESCRIPTION The present invention provides aspects for soft error detection for a superscalar microprocessor.
The aspects include a first pipeline, the first pipeline including a first arithmetic logic unit, ALU, comparator and a first general purpose register, GPR, for storing first data, and a second pipeline, the second pipeline including a second GPR and a second ALU comparator, the second GPR for storing second data, the second data being a copy of the first data.
A detection system utilizes one of the first and second ALU comparators to perform a comparison of the second data with the first data during an idle state of the first and second pipelines.
Through the present invention, soft error detection occurs in a manner that overcomes deficiencies with prior art approaches.
The present invention provides soft error detection efficiently by taking advantage of an existing data transfer mechanism and a 64-bit comparator already in the ALU of FXU pipelines.
These and other advantages of the aspects of the present invention will be more fully understood in conjunction with the following detailed description and accompanying drawings.
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Fault Detection 
