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 Testing of digital-to-analog converters

Details
Inventors: Kakizawa, Akira; Ortega, Carlos A.; Arellano, Mark A.;
Assignee: Intel Corporation (Santa Clara, CA)
Primary Examiner: Cuneo; Kamand
Assistant Examiner: Nguyen; Jimmy
Attorney, Agent or Firm: Fish & Richardson P.C.

A technique for testing digital-to-analog converters includes providing a set of digital input signals to the digital-to-analog converters and comparing a resulting combined output signal from the digital-to-analog converters to a comparison value. A determination is made as to whether the resulting combined output signal is within a predetermined tolerance defined by the comparison value. An apparatus for testing digital-to-analog converters also is disclosed.

DETAILED DESCRIPTION In general, a technique for testing digital-to-analog converters includes providing a set of digital input signals to the digital-to-analog converters and comparing a resulting combined output signal from the digital-to-analog converters to a comparison value.
A determination is made as to whether the resulting combined output signal is within a predetermined tolerance defined by the comparison value.
An apparatus for testing digital-to-analog converters also is disclosed.
Various features and advantages will be readily apparent from the following detailed description, the accompanying drawings, and the claims.



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