Inventors: Hennessey, Audrey Kathleen; Lin, YouLing; Khaja, Veera V. S.; Pattikonda, Ramakrishna; Reddy, Rajasekar; Lu, Huitian; Katragadda, Ramachandra;
Assignee: Texas Instruments Incorporated (Dallas, TX)
Primary Examiner: Johns; Andrew W.
Assistant Examiner:
Attorney, Agent or Firm: Troike; Robert L., Donaldson; Richard L.
An apparatus and method for automatic knowledge-based object or anomaly classification is provided by capturing a pixel map of an image and from that generating high level descriptors of the object or anomaly such as size, shape, color and sharpness. These descriptors are compared with sets of descriptors in a knowledge-base to classify the object or anomaly. |