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 Electronic component using a silicon carbide substrate and a method of making it

Details
Inventors: Kanda, Atsushi; Takagi, Shunichi; Kambe, Rokuro;
Assignee: NGK Spark Plug Co., Ltd. (Aichi, JP)
Primary Examiner: Rutledge; L. Dewayne
Assistant Examiner: Zimmerman; John J.
Attorney, Agent or Firm: Finnegan, Henderson, Farabow, Garrett & Dunner

The bond strength between a silicon carbide substrate and a metal layer comprised of a series of metal films is improved without detrimentally affecting other properties of such a device by interposing a layer of silicon, Si.sub.2 Mo or mixtures thereof between the substrate and the first metal film in the layer which is preferably Ti, Zr or Hf.

DETAILED DESCRIPTION What is claimed is: 1.
An electronic device comprising: a sintered substrate consisting essentially of silicon carbide; an intermediate layer consisting essentially of a material selected from the group consisting of silicon, molybdenum disilicide and mixtures thereof, said material being applied to a surface of said substrate, said intermediate layer having a thickness in the range of from about 500 .
ANG.
to 5000 .
ANG.
; and a metal layer applied to the surface of said intermediate layer.
2.
The device of claim 1 wherein said metal layer applied to said intermediate layer includes a metal film applied to said intermediate layer, said metal film consisting essentially of a metal selected from the group consisting of titanium, zirconium and hafnium.
3.
The device of claim 2 wherein said metal film has a thickness in the range of from 1000 to 2000 .
ANG.
.
4.
An electronic device comprising: a sintered substrate consisting essentially of silicon carbide; an intermediate layer consisting essentially of a material selected from the group consisting of silicon, molybdenum disilicide and mixtures thereof, said material being applied to a surface of said substrate, said intermediate layer having a thickness in the range of from about 500 .
ANG.
to 5000 .
ANG.
; and a metal layer comprised of a first metal film applied to a surface of said intermediate layer and a plurality of metal films applied in layers on said first metal film.
5.
The device of claim 4 wherein said first metal film consists essentially of a metal selected from the group consisting of titanium, zirconium and hafnium.
6.
The device of claim 5 wherein said first metal film has a thickness in the range of from 1000 to 2000 .
ANG.
.
7.
The device of claim 5 wherein said plurality of metal films applied to said first metal film comprise: a second metal film consisting essentially of a metal selected from the group consisting of chromium, molybdenum and tungsten; and a third metal film consisting essentially of a metal selected from the group consisting of copper, silver and gold



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