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 Method and apparatus for testing an integrated circuit

Details
Inventors: Delvigne, Josephus;
Assignee: U.S. Philips Corporation (New York, NY)
Primary Examiner: Strecker; Gerard R.
Assistant Examiner: Snow; Walter E.
Attorney, Agent or Firm: Miller; Paul R.

In order to set the circuit to be tested to a test mode, at least one output is led out by an output stage, and the input and output of the output stage internally leads to an exclusive-OR gate. As long as the output has a comparatively high-ohmic termination, as is the case during the normal mode of operation, the exclusive-OR gate will carry the same signal for both signal conditions of the output. For the purpose of testing a complementary pulse pattern is applied to the output, so that the exclusive-OR gate supplies an opposite signal, which establishes the test mode. The output of the exclusive-OR gate may lead to a bistable multivibrator, so that for establishing the test mode only a single complementary signal is required.

DETAILED DESCRIPTION What is claimed is: 1.
A method of testing an integrated circuit which generates at least one digital output signal comprising the steps of: connecting an integrated circuit device of said integrated circuit to a first stage of an output circuit, connecting said first stage of said output circuit to a logic circuit and to an output stage of said output circuit, said logic circuit evaluating a combination of signal conditions and said logic circuit controlling a test mode, connecting said logic circuit to a test control circuit, said test control circuit causing said integrated circuit device to be switched to said test mode upon application of a signal pattern, and applying said signal pattern to said output stage to set said test mode, said signal pattern being complementary to a time signal pattern to be generated.
2.
An arrangement for carrying out a method of testing an integrated circuit which generates at least one digital output signal comprising: first means for connecting an integrated circuit device of said integrated circuit to a first stage of an output circuit, second means for connecting said first stage of said output circuit to a logic circuit and to an output stage of said output circuit, said logic circuit evaluating a combination of signal conditions and said logic circuit controlling a test mode, third means for connecting said logic circuit to a test control circuit, said test control circuit switching said integrated circuit device to said test mode upon application of a signal pattern, and fourth means for applying said signal pattern to said output stage to set said test mode, said signal pattern being complementary to a time signal pattern to be generated, wherein said logic circuit is an exclusive OR-gate having an output connected to a control input of said test control circuit.
3.
An arrangement according to claim 2, wherein said output circuit is a non-inverting circuit stage, and said test control circuit is set to said test mode by a logic 0 on said control input by said logic circuit



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