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 Power transistor thermal shutdown circuit

Details
Inventors: Widlar, Robert J.;
Assignee: National Semiconductor Corporation (Santa Clara, CA)
Primary Examiner: Pellinen; A. D.
Assistant Examiner: Gaffin; Jeffrey A.
Attorney, Agent or Firm: Woodward; Gail W.

A thermal shutdown circuit for use with a high power transistor which incorporates a sense emitter. A differential amplifier is driven from the transistor base and the sense emitter and has an output that is coupled to the power transistor base. When the sense emitter potential exceeds the base potential, the amplifier output will pull the base down so as to limit the current in the power transistor. For a silicon transistor, the circuit will act to limit the hottest portion of the sense emitter to a maximum of about 250.degree. C. When there are no hot spots and the sense emitter is heated uniformly, heating of the transistor will be limited to about 200.degree. C.

DETAILED DESCRIPTION I claim: 1.
In a power transistor having base, emitter and collector electrodes along with a separate distributed sense emitter thermally associated closely with a plurality of individual emitter elements, a thermal shutdown circuit comprising: means for current biasing said distributed sense emitter whereby said distributed sense emitter will operate at a potential determined by its hottest portion; means for sensing the differential potential between said distributed sense emitter and said power transistor base; and means for reducing the current in said power transistor when the potential at said distributed sense emitter indicates excessive temperature.
2.
The circuit of claim 1 wherein said means for sensing comprise a differential input stage having one input coupled to said distributed sense emitter, the other input coupled to said power transistor base, and an output coupled to said means for reducing the current in said power transistor.
3.
The circuit of claim 2 wherein said differential input stage output is coupled to a current mirror load which has a differential input, a single-ended output and operates at low current.
4.
The circuit of claim 3 wherein said current mirror load is composed of NPN transistors operating in their inverted condition whereby their leakage current at temperatures in the vicinity of the transistor shutdown temperature is small compared to their operating current.
5.
The circuit of claim 4 wherein said output of said current mirror load is coupled to the input of a high gain inverting amplifier stage which in turn drives said means for reducing the current in said power transistor.
6.
The circuit of claim 5 wherein said current mirror load is operated from current supplies that provide said low current which is maintained at a level that is small with respect to the tail current in said differential input stage.




Description:
BACKGROUND OF THE INVENTION My copending patent application Ser.
No.
698,043 which was filed Feb



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