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 Monitoring circuit

Details
Inventors: Feilchenfeld, Michal M.; Daggett, Kenneth E.; Lloyd, Raymond A.;
Assignee: Westinghouse Electric Corp. (Pittsburgh, PA)
Primary Examiner: Smith; Jerry
Assistant Examiner:
Attorney, Agent or Firm: Hinson; J. B.

A monitoring circuit for digital circuits is disclosed. The monitor is primarily applicable to digital circuits which operate in a cyclic mode with the digital patterns generated during each cycle being repeated in a predictable manner. A predetermined number of expected bit patterns are stored in a programmable memory. The stored bit patterns correspond on a bit-by-bit basis to the bit patterns generated by the circuit being monitored when this circuit is operating normally. In the self-scan mode each pattern generated by the circuit being monitored is compared to each of the patterns stored in the memory in a sequential manner. Each time a pattern generated by the circuit being monitored is found to identically correspond to a pattern stored in the memory a valid pattern pulse is generated which steps a down counter one count. If this process does not result in the down counter being stepped the expected number of times during the operating cycle, a flip-flop is set indicating that the circuit being monitored has malfunctioned. Provisions are also included for counting the transitions of a digital signal during predetermined portions of the cycle of the circuit being monitored and for monitoring the polarity and amplitude of a predetermined number of analog voltages. The result of all of these tests are combined to generate a signal indicating the operational status of the circuit being monitored. The monitoring circuit may also be operated in a one-to-one correspondence mode. In this mode each bit pattern generated by the circuit being monitored are compared to bit patterns stored in a selected memory location. If these bit patterns are not identical, a malfunction signal is generated.

DETAILED DESCRIPTION FIG.
1 is a simplified functional block diagram of the monitoring circuit which is the subject of this invention.
The monitoring circuit may either be operated in the self-scan or the one-to-one correspondence modes.
In either case the circuit being monitored generates a series of bit patterns which are coupled to the monitoring circuit as inputs.
Each of the patterns is indicative of the operational status or the circuit being monitored at the time the pattern is generated.
In the self-scan mode a selected number of patterns are compared to one or more digital data words which are stored in a memory.
Normal operation is inferred from a one-to-one bit correspondence between each of the selected bit patterns, generated by the device being monitored, and at least one of the bit patterns stored in the memory resulting in the total number of correspondence cases per cycle being equal to the number or selected bit patterns.
In the one-to-one correspondence mode, each of the selected bit patterns generated by the device being monitored is compared to a selected bit pattern stored in the memory.
Normal operation is inferred by a one-to-one correspondence of these values.
In either mode, the highest number of selected bit patterns is determined by the capacity of the memory.
The system may also include analog signal and frequency monitoring circuits although these features are not illustrated in FIG.
1 and not required by many applications.
In the self-scan mode the monitoring circuit illustrated in FIG.
1 receives a cycle timing signal from the circuit being monitored.
Each pulse of this signal defines the beginning of a cycle of the circuit being monitored.
A pulsed trigger signal to initiate the comparison of each of the selected bit patterns generated by the device being monitored to the stored bit patterns is also generated by the device being monitored.
Between adjacent pulses of the trigger signal, the monitoring circuit compares the multibit pattern coupled to the monitoring circuit to each of the multibit patterns stored in the digital memory



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