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 Cantilever having sensor system for independent measurement of force and torque

Details
Inventors: Shivaram, Bellave S.; Chaparala, Murali V.; Jones, Stephen H.;
Assignee:
Primary Examiner: Larkin; Daniel S.
Assistant Examiner:
Attorney, Agent or Firm: Parker; Sheldon H.

A cantilever structure is provided having a cantilever arm with a piezo-active detector embedded on the surface at the fixed end of the cantilever as well as at a sensing point close to the free end along with an integrated amplification circuitry. Deflection of the cantilever arm is initiated by two different methods: (a) by a force at the free end which induces a surface strain at the base of the cantilever and no strain at the free end and (b) by a torque at the free end which induces a maximum strain at the free end but no strain at the base of the cantilever. In the first case a piezo-active signal is produced only in the detector at the base and in the second case only in the detector close to the free end. When both force and torque cause the deflection of the cantilever end, their contributions are separated by comparing the signals produced by both the detectors with that produced by a third `reference` detector which is not part of the cantilever arm but is still situated in close proximity.

DETAILED DESCRIPTION It has now been discovered, that improved operation and capabilities of a cantilever measuring device can be achieved through the separate measurement of force and torque contributions to the deflection of the cantilever.
Using recent technological improvements in the processing of semiconducting and ferromagnetic materials (Si & Fe), a new type of cantilever sensor with active detectors has been fabricated, which enables the separation of the measurement of the force and torque contributions to the deflection of the cantilever.
The active detectors provide an order of magnitude more sensitive than the above described capacitance cantilever sensor.
These new sensors utilize the strain dependence in the characteristics of Field Effect Transistors (FETs) placed on the surface of the cantilevers.
The FETs have thus been integrated into the cantilever sensor and this has enabled the deflection induced signals to become amplified at the very point of origin.
It has also enabled the use of the sensors in environments where low power dissipation is necessary.
These sensors are useful in scanning probe magnetic force microscopy MFM), magnetic resonance force microscopy, force and/or torque magnetometry, in reading of all types of magnetic information, including those on disk drives and agglomerates of magnetic molecules and atoms.
The use of the new integrated FET sensors, in addition to increasing the sensitivity, has simplified many of the measurement processes by eliminating the number of external components needed.
Furthermore, the technology we have developed is modular in nature and several sensor models scaleable for smaller/larger signals have been built.
The present invention is a cantilever arm with a detector (passive or active) at the fixed (base) end of the cantilever and a second similar detector at the free end for use in separating the force and torque contributions to the deflection of the cantilever.
Deflection of the free end of the cantilever by a force produces a strain in the base of the cantilever and the deflection of the free end by a torque produces no strain in the base but produces maximum strain at the free end



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