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Details
Inventors: Mohon, Windell N.;
Assignee: The United States of America as represented by the Secretary of the Navy (Washington, DC)
Primary Examiner: Corbin; John K.
Assistant Examiner: Rosenberger; R. A.
Attorney, Agent or Firm: Sciascia; Richard S., Doty; Don D.

An instrument for measuring various and sundry parameters that are analog to the aberrations that may exist in holographic lenses and other energy diffraction apparatus is disclosed as containing: a laser energy source; a pair of masks for controlling precisely the path of the light from said laser energy source, so that it may be used as a reference parameter; a rotatable mounting table for holding the holographic lens being tested in an appropriate position in the path of said reference laser light path; a microscope positioned to receive predetermined laser light rays that have been diffracted by the holographic lens being tested; indicia to measure the X, Y and Z axes distances between that point on the holographic lens being tested where the aforesaid laser light path passes therethrough and a given point position on or with respect to said microscope; and a support bench upon which all of the aforesaid elements may be mounted, so that their respective relative positions may be controlled in such manner that they form a unique geometrical configuration and combination.

DETAILED DESCRIPTION What is claimed is: 1.
An apparatus for measuring parameters that are analogous to aberrations in an energy diffraction means, comprising in combination: means for generating and projecting a predetermined energy having a predetermined wavelength; first mask means spatially disposed from said predetermined energy generating and projecting means and in the path of the energy projected thereby for masking predetermined portions thereof in accordance with a first masking pattern; rotatable means spatially disposed from said first masking means for mounting an energy diffraction means in the path of the energy passed therethrough in such manner that a portion of the energy received by said energy diffraction means will be diffracted in accordance with the diffraction grating thereof; second mask means spatially disposed from said rotatable energy diffraction means mounting means and in the path of the energy not diffracted by said energy diffraction means for the aligning thereof in accordance with a second masking pattern; semi-clear screen means movably and spatially disposed from the aforesaid mounting means in such manner that the diffracted energy from said energy diffraction means will obliquely impact on one side thereof and partially pass therethrough; detector means contiguously disposed with the other side of said semi-clear screen means in such manner as to be responsive to and centered upon that portion of said diffracted energy which passes therethrough; and means effectively positioned with respect to the location where said energy passes through the aforesaid energy diffraction means and the location on said screen where said energy obliquely impacts thereon for indicating the X, Y, Z axes distances therebetween, respectively.
2.
The invention of claim 1, wherein: the distance between said predetermined energy generating and projecting means and the aforesaid first masking means is ten centimeters; the distance between said first masking means and the center of the aforesaid rotatable energy diffraction means mounting means is one hundred centimeters; the distance between the center of the aforesaid rotatable energy diffraction means mounting means and the aforesaid second masking means is two hundred centimeters; and the distance between the center of said rotatable energy diffraction means mounting means and the center of the aforesaid semi-clear screen means is variable



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