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Circuit and method for testing a disk drive head assembly without probing
| Details |
Inventors: Davis, Bradley K.; Voorman, Johannes O.; Ramalho, Joao N. V. L.; Gamand, Patrice;
Assignee: Hewlett-Packard Company (Palo Alto, CA); Philips Electronics N.V. (NL)
Primary Examiner: Strecker; Gerard R.
Assistant Examiner:
Attorney, Agent or Firm: Simmons; Lane R.
A preamplifier circuit for a computer data storage system disk drive read/write head (or HSA) includes multiple test modes to enable electrical testing of the preamplifier, the read/write heads, and associated circuitry without physically probing the components or circuitry. Communication between the preamplifier and a host controller provides for test mode selection and test mode enablement within the preamplifier. Testing occurs using only the normal interface connector to the head disk assembly (HDA) in which the preamplifier and HSA are embodied. Properties such as electrical resistance, ESD, preamplifier bond wire connection integrity, head bond wire and solder joint integrity, and connections from the head slider to the preamplifier leads are all tested. Testing occurs without probing to provide efficient, reliable, and cost effective manufacturing and testing benefits of the read/write heads, flex assembly, HSA, and HDA. |
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DETAILED DESCRIPTION OF THE INVENTION FIG.
1 represents a block diagram of the present invention preamplifier test circuit 10 and system 15 for testing a computer data storage system disk drive read/write head 20 (or HSA) and associated circuitry without physically probing the components or circuitry.
The system includes preamplifier 10, read/write head 20, host controller 30, and voltmeter (or multimeter) means 50.
The preamplifier circuit 10 includes serial interface memory registers 25 which are used for enablement of multiple test modes for electrical testing of preamplifier 10, read/write heads 20 (or HSA), and/or associated connecting circuitry.
Typically, preamplifier 10 is electrically attached to a flexible or rigid printed wiring substrate (not shown), often referred to as a flex assembly.
Circuit lines embodied in the flex assembly communicate between preamplifier 10 and an external connection, such as a conventional 24 pin connector.
An advantage of the present invention is that not only does testing occur without probing but also without increasing circuit lines in the flex assembly.
Specifically, testing occurs using the existing flex assembly and external interface connection components.
Where electrical functions and connections are described in this disclosure, it is understood that it is possible, within the scope of this invention, to use equivalent circuits to perform the described functions.
As an example, a transistor can be used as a diode or resistor.
Likewise, two electrical components which are connected may have interceding components which physically separate the two components.
"Connected" is, therefore, intended to include components which are in electrical communication despite intervening components.
Preamplifier 10 has a serial input means which includes: (1) registers 25 for receiving and storing predetermined digital signals, including a test mode signal indicative of the preamplifier being placed in a selected test mode, and (2) a serial communication interface signal line SDATA connected to host controller 30 for transmitting the predetermined digital signals, including the test mode signal, to registers 25
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I/O Systems 
