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Home I/O Systems Delay-time-checking-arrangement

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 Delay time checking arrangement

Details
Inventors: Satoh, Tatsuo;
Assignee: NEC Corporation (Tokyo, JP)
Primary Examiner: Atkinson; Charles E.
Assistant Examiner:
Attorney, Agent or Firm: Helfgott & Karas

A circuit arrangement for checking excessive time delay in the propagation of signals between two circuit blocks is provided in which two successive square wave clock signals are generated, each having a cycle period equal to the maximum permissible time delay, and a test signal is propagated between the circuit blocks initiated together with the first clock signal. The times of receipt by the second circuit block of the test signal and each clock signal are stored, and means are provided for producing a disparity signal whenever there is a disparity between the two stored signals. A third clock signal is generated which lags the second clock signal and this is compared with the disparity signal to produce an excess delay indicating signal whenever they simultaneously occur.

DETAILED DESCRIPTION Accordingly, it is an object of the present invention, to provide a delay time checking arrangement for checking the delay time in a signal propagated between first and second circuit blocks to be checked.
This time delay checking arrangement comprises clock generator means for generating a first clock signal and a second clock signal lagging behind the first clock signal said first and second clock signals having a cycle period equal to a predetermined maximum delay time, transfer means for propagating a test signal, supplied from the first circuit block in synchronism with the first clock signal, to the second circuit block; first memory means contained in said second circuit block to store the test signal in synchronism with the first clock signal; second memory means contained in the second circuit block to store the test signal in synchronism with the second clock signal; and detector means for continuing to produce a disparity signal as long as disparity is detected between the output signal of the first memory means and that of the second memory means beyond a time period of the second clock signal.
An excess time delay indication is also provided by generating a third clock signal, and by comparing this third clock signal with the disparity signal to produce an output excess time delay indicating signal whenever they occur simultaneously.



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