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Home I/O Systems Latched-type-clock-synchronizer-with-additional-180-degree-phase-shift-clock

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Details
Inventors: Tien, Li-Chin; Wang, Gyh-Bin;
Assignee: Etron Technology, Inc. (Hsin-Chu, TW)
Primary Examiner: Nguyen; Tan T.
Assistant Examiner:
Attorney, Agent or Firm: Saile; George O., Ackerman; Stephen B., Knowles; Billy J.

A multiple phase latched type synchronized clock circuit that will create a multiple phases of an internal clock signal in an integrated circuit that is synchronized with an external system clock signal is disclosed. A latched type clock synchronizer circuit has an input buffer circuit to receive the external input clock to create a first timing clock. The input buffer is connected to a delay monitor circuit to delay the first timing clock by a first delay factor to create a second timing clock. A delay measurement latch array is connected to the input buffer circuit and the delay monitor circuit to create a latched measurement signal, which indicates a period of time between a second pulse of the first timing clock and a first pulse of the second timing clock. A multiple delay array is connected to the input buffer to receive the first timing clock and will create multiple pluralities of incrementally delayed timing clocks. The multiple pluralities of incrementally delay timing clocks and the latched measurement signal are the inputs to a plurality of phase generators that create a plurality of third timing clocks. Each of a plurality of internal buffers is connected to each of the phase generators to receive one of the third timing clocks. The third timing clock is shaped to create one of the multiple phases of the internal clocks which are then buffered, amplified and transmitted to the integrated circuit.

DETAILED DESCRIPTION An object of this invention is to provide an internal clock circuit in an integrated circuit that will create an internal clock signal that is synchronized with from an external system clock signal.
Another object of this invention is to provide an internal clock circuit within an integrated circuit that will provide multiple clock signals that are synchronized to an external clock signal.
To accomplish these and other objects a latched type clock synchronizer circuit has an input buffer circuit to receive, buffer, and amplify the external input clock to create a first timing clock.
The input buffer is connected to a a delay monitor circuit to delay the first timing clock by a first delay factor to create a second timing clock.
A delay measurement latch array is connected to the input buffer circuit and the delay monitor circuit to create a latched measurement signal.
The latched measurement signal indicates a period of time between a second pulse of the first timing clock and a first pulse of the second timing clock.
A multiple delay array is connected to the input buffer to receive the first timing signal.
The multiple delay array will create multiple pluralities of incrementally delayed timing clocks.
The multiple pluralities of incrementally delay timing clocks are the inputs to a plurality of phase generators.
The plurality of phase generators will create a plurality of third timing clocks.
Each phase generator will also receive the latched measurement signal.
Each phase generator will logically combine the multiple pluralities of incrementally delay timing clocks and the latched measurement signal to select one of the incrementally delayed timing clocks to create each of the third timing clocks.
Each of a plurality of internal buffers is connected to each of the phase generators to receive one of the third timing clocks.
Each of the internal buffers will shape the third timing clock to create one of the multiple phases of the internal clocks and then buffer, amplify and transmit the phase of the internal clock to the integrated circuit



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