Automatic identification and correction of bad pixels in a large area solid state x-ray detector

DETAILED DESCRIPTION The present invention provides such a means for identifying and correcting for bad pixels in a large area solid state x-ray detector, whereby bad pixel values are replaced by values that blend in with neighboring good pixels in a displayed image.
In accordance with one aspect of the present invention, a method for identifying and correcting bad pixels in an x-ray image produced by a large area solid state x-ray detector is disclosed.
Initially, each bad pixel is identified.
An appropriate correction scheme is then selected from a predetermined list.
A correction code is then assigned to each bad pixel, the correction code corresponding to the selected correction scheme.
The correction code is stored in a pixel-correction memory, and the correction code for each pixel is read during imaging.
Finally, each bad pixel value found during the correction code reading is replaced using the selected correction scheme, and can be immediately displayed.
Accordingly, it is an object of the present invention to provide a means for identifying bad pixels in a large area solid state x-ray detector.
It is a further object of the present invention to provide a means for correcting the values of these bad pixels in an x-ray image.
Other objects and advantages of the invention will be apparent from the following description, the accompanying drawings and the appended claims.