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 Method and apparatus for validating a paper-like piece

Details
Inventors: Yoshihara, Kenzo;
Assignee: Nippon Conlux Co., Ltd. (Tokyo, JP)
Primary Examiner: Bartuska; F. J.
Assistant Examiner:
Attorney, Agent or Firm: Graham & James

An apparatus and method for validating a paper-like piece are of a type having a detector which irradiates light onto a deposited paper-like piece and thereby produces a detection signal corresponding to a pattern on the paper-like piece and validating the paper-like piece by collating the detection signal produced by the detector in response to deposition of the paper-like piece with a predetermined standard pattern. Features of the apparatus and method are that a reference paper-like piece having no particular pattern is deposited and reference level data is obtained on the basis of a detection signal produced by the detector in response to this deposition, that data to be examined is provided by converting a detection signal produced by the detector in response to deposition of a paper-like piece to be validated to a ratio to or deviation from the reference level data and that validation is made by collating this data to be examined with the standard pattern. Since the base for normalizing measured data for collation is set at the level of the reference paper-like piece, validation becomes less vulnerable to adverse effects by a parts error and an assembling error in an optical type detector with resulting improvement in the validation accuracy.

DETAILED DESCRIPTION It is, therefore, an object of the invention to provide a method and an apparatus for validating a paper-like piece capable of performing accurate validation and collation taking into account the parts and assembling errors of an optical sensor.
It is another object of the invention to provide a method and an apparatus for validating a paper-like piece capable of performing accurate validation and collation taking into account the parts and assembling errors regardless of variation in the measuring data due to soil or fatigue of a paper-like piece or soil or deterioration of the sensor.
The apparatus for validating a paper-like piece according to the invention comprises a detection section for producing a detection signal corresponding to a pattern onto a deposited paper-like piece by irradiating light on the paper-like piece, a reference level data providing section for preparing reference level data on the basis of a detection signal produced by said detection section in response to deposition of a reference paper-like piece on which no particular pattern is provided and providing this reference level data, a standard pattern providing section for providing a predetermined standard pattern corresponding to a pattern of a true paper-like piece, a data-to-be-examined providing section for providing data to be examined which is obtained by converting a detection signal produced by said detection section in response to deposition of a paper-like piece to be validated to a ratio to or deviation from the reference level data provided by said reference level data providing section, and a determination section for determining whether the paper-like piece to be validated is true or false by collating the data to be examined provided by said data-to-be examined providing section with the standard pattern provided by said standard pattern providing section.
According to the invention, reference level data for normalization is provided by using a reference paper-like piece having no particular pattern (e



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