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Home Image Analysis Solid-state-imaging-apparatus-and-method-with-expanded-dynamic-range

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 Solid state imaging apparatus and method with expanded dynamic range

Details
Inventors: Busby, Peter W.;
Assignee: British Aerospace Public Limited Company (London, GB2)
Primary Examiner: Ng; Jin F.
Assistant Examiner: Brinich; Stephen
Attorney, Agent or Firm: Nixon & Vanderhye

Solid state imaging apparatus comprising a charge-coupled frame transfer image sensor including an image-sensitive integration region for forming a charge pattern representative of an incident image, first and second storage regions associated with respective opposed ends of said integration region, and charge transfer means for shifting the charge pattern formed in said integration region into a selected one of said storage regions.

DETAILED DESCRIPTION What is claimed is: 1.
Solid state imaging apparatus comprising: a charge-coupled frame transfer image sensor including: an image-sensitive integration region for forming a charge pattern representative of an incident image; a first image storage region in charge transfer relationship with one end of said image integration region capable of receiving at least a major part of the charge pattern formed in said integration region and including first storage region signal read-out means, and a second image storage region in charge transfer relationship with an opposed end of said image integration region capable of receiving at least a major part of the charge pattern formed in said integration region and including second storage region signal read-out means, and charge transfer means for shifting the charge pattern formed on said integration region into a selected one of said image storage regions, said imaging apparatus further comprising control means for setting a continuing series of field time periods and for defining in each field time period a long exposure period and a short exposure period and for controlling said charge transfer means to shift the charge pattern integrated during successive long and short exposure periods alternately into said first and second storage regions respectively and for controlling said first storage region signal read-out means and said second region signal read-out means to output data representing a series of long exposure shots and data representing a series of short exposure shots respectively, each series being output at the field rate defined by said field time period.
2.
Solid state imaging apparatus according to claim 1, wherein said control means is operable to vary the lengths of the long and short exposure periods.
3.
Solid state imaging apparatus according to claim 1, wherein said control means defines within each field time period a long exposure period, a short exposure period, and a further period, and the control means is operable to cause the charge pattern formed during said further period to become lost



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