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Method of compensating scattered characteristics of outputs of an infrared detector of multiple-element type
| Details |
Inventors: Hanafusa, Tsutomu; Shiraishi, Kikuo;
Assignee: Fujitsu Limited ()
Primary Examiner: Britton; Howard W.
Assistant Examiner:
Attorney, Agent or Firm: Staas & Halsey
In the method of the present invention for compensating scattered characteristics of infrared detector elements, a scene to be monitored is input through a focusing lens onto the infrared detector elements and the scene on the infrared detector elements is defocused or placed out of focus by adjusting the focusing lens. In addition, in the method a first signal level output from each detector element is then measured, the scene is focused, and a second signal level output from each detector element is compensated according to thus obtained measured signal having an average level. In the case where the scene is optically scanned on the linearly arranged detector elements, the first signal level may be averaged for a predetermined number of scans to obtain an average level of each detector element, and may be further averaged on a plurality of the scan directions slanted or rotated with respect to the scene. The scan direction is rotated by rotating a prism placed in the light path around the light path, to predetermined angular positions between 0 to 90 degrees so that the light input to the detector element is more properly averaged, to provide an improved average level. Temperature data of the central portion of the scene may be deleted omitted from the averaging operation because the central portion includes noises caused from a narcissus effect. In addition, temperature data is excluded because in the case where the scan directions are slanted by the prism rotation the central portion always detects the same object, the averaging of the scene is deteriorated. |
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DETAILED DESCRIPTION It is a general object of the invention, therefore, to provide a simple and accurate method for compensating scattered characteristics of infrared temperature detecting elements without requiring a particular mechanism.
In the method of the present invention for compensating scattered characteristics of infrared detector elements, a scene to be monitored is input through a focusing lens onto the infrared detector elements.
The scene on the infrared detector elements is defocused or placed out of focus by adjusting the focusing lens so that the input scene is averaged equally onto all of the infrared detector elements; and signal levels output from individual detector elements are measured as first signal levels of detector elements.
Next, the focus is adjusted so as to focus the scene on the detector elements; and second signal levels output from the individual infrared detector elements are compensated according to the thus obtained first average for each detector element.
In the case where the scene is optionally scanned on the linearly arranged detector elements, the first signal level may be averaged for a predetermined scan number to obtain a first average level of each detector element.
The optical averaging may be further improved by averaging the first signal level or the first averaged level of each element for a plurality of the scan directions slanted or rotated with respect to the scene.
The scan direction is rotated by rotating a prism placed in the light path on the way to or projected on a scanning mirror, around the light path, to predetermined angular positions between 0 to 90 degrees so that the light input to the detector element is more properly averaged, to provide an improved average level.
Temperature data of a central portion of the scene may be deleted from the averaging operation because the central portion includes noises caused from narcissus effect, and because in the case where the scan directions are slanted by a prism rotation the central portion always detects a same object, which deteriorates the averaging of the scene
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