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| Novel bistable light modulators and display element and arrays therefrom |
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| Method and electrolytic display for selectively displaying an image |
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| Lens support |
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Multi-axis universal circuit board test fixture
| Details |
Inventors: Hunt, Bill; Parshotam, Mahesh;
Assignee: Huntron, Inc. (Mill Creek, WA)
Primary Examiner: Karlsen; Ernest F.
Assistant Examiner:
Attorney, Agent or Firm: Graybeal, Jensen & Puntigam
A test fixture (10) which includes a base portion (12) and upstanding successive side walls (16, 17, and 18) integral with the base portion (12). Lateral grooves (22, 24, 26) extend around the inner surface of the three side walls (16, 17, and 18). A first movable clamp 30 is positioned between opposing side walls 16 and 18 and is movable in a selected slot (22, 24, 26) toward and away from the intermediate side wall 17. A second movable clamp (80) is mounted on and movable along the first clamp 30 and extends a small distance in the direction of the intermediate side wall (17). A circuit board (90) to be tested is typically clamped between the side walls (16 and 17) and the first and second clamps (30 and 80). A test probe (130) is positioned in a holder (91) which is mounted for movement between the first and third side walls (16 and 18) and toward and away from the second intermediate side wall (17). The position of the probe holder (91) relative to the board (90) is recognized by an optics system (142). |
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DETAILED DESCRIPTION We claim: 1.
A test fixture apparatus for testing the operation of a circuit board containing a number of circuit elements, comprising: a supporting base member having an upstanding wall around three successive sides thereof extending from the upper surface thereof, thereby defining three successive wall portions which are fixed in relation to each other, the first and third wall portions being parallel and at right angles to the second intermediate wall portion, including circuit board holding elements at the interior surface of the three wall portions adapted to receive the edge of a circuit board therein; a first clamp member extending between the first and third wall portions and movable toward and away from the second wall portion, wherein said first clamp member has a surface having circuit board holding elements in the same plane as the holding elements in the first and second wall portions and wherein said first clamp member is elongated with opposing ends and includes means at said opposing ends for mating with receiving means on the interior surfaces of both the first and third wall portions for support of said first clamp member and to permit controlled movement of said first clamp member toward and away from the second wall portion, said first clamp member further including means cooperating with said mating means for selectively locking said first clamp member in place; and means, supported by said upstanding wall, for movably positioning a test probe relative to the circuit board to be tested.
2.
An apparatus of claim 1, wherein the circuit board holding elements in the three wall portions comprise a continuous groove therein and the circuit board holding element in the first clamp member comprises a continuous groove and wherein said receiving means on the interior surfaces of said first and third wall portions is also said continuous groove, said mating means on the opposing ends of said first clamp member comprising projections which extend outwardly from said opposing ends, engaging said continuous groove
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