Arm-knee and leg guard for desks and file cabinets |
| These and other objects are accomplished in accordance with the present invention by providing a ... |
|
Reflector for use in an artificial lighting device |
| I claim: 1. An artifical lighting assembly comprising: an artifical source of illumination having ... |
|
Optical system for synthesizing plural light beams |
| Accordingly, it is an object of the present invention to provide an optical system which can ... |
|
Device for feeding fiber or cable through a housing |
| OF THE INVENTION Shown in FIG. 1 is an implementation of the present invention in a ... |
|
Solar concentrator |
| I claim: 1. A solar radiation concentrator comprising: trough means, having an open portion, for ... |
|
Radiant energy collector |
| A device is provided for reflecting radiant energy incident thereon onto the surface of an energy ... |
|
Antireflection coating for infrared light |
| An object of the present invention is to provide an antireflection coating which is formed on a ... |
|
Optical light guide for dental light-curing lamps |
| An optical light guide composed of a solid, transparent material selected from the class consisting ... |
|
Fiber optic cable end connector |
| An end connector in accordance with the present invention has a housing member with a through ... |
|
Endoscope light source apparatus with detachable flash unit |
| An object of the present invention is to provide an endoscope light source apparatus which is ... |
|
|
Rotatable substrate supporting mechanism with temperature sensing device for use in chemical vapor deposition equipment
| Details |
Inventors: deBoer, Wiebe B.; Ozias, Albert E.;
Assignee:
Primary Examiner: Pianalto; Bernard
Assistant Examiner:
Attorney, Agent or Firm: Cahill, Sutton & Thomas
A rotatable substrate supporting mechanism for use in a chemical vapor deposition reaction chamber of the type used in producing semi-conductor devices is provided with a susceptor for supporting a single substrate, or wafer, for rotation about an axis normal to the center of the wafer. The mechanism is provided with a temperature sensing system for producing signals indicative of sensed temperatures taken at the center of the susceptor and at various points about the periphery thereof. A gas purging system is provided for inhibiting the flow of reactant gas in unwanted areas of the reaction chamber and in the supporting system itself. Rotational driving of the mechanism is accomplished by a variable speed motor under control of a circuit which stops and starts the rotation at controlled speeds and stops the rotation at a home position for enhancing the handling of the wafers. |
|
DETAILED DESCRIPTION In accordance with the present invention, a new and useful rotatable substrate supporting mechanism is disclosed for use in single substrate chemical vapor deposition equipment. The rotatable substrate supporting mechanism includes a circular susceptor, or platform, for receiving a single circular substrate and supporting the substrate in the reactant gas flow path through the reaction chamber. The susceptor is provided with an axially depending driveshaft which is suitably coupled to a variable speed drive means for rotation of the susceptor, and thus the substrate, about a vertical rotation axis. By rotating the substrate about this axis, which is normal with respect to the center of the substrate, an averaging of the deposited material growth rates results thus overcoming the problem in concentration depletion of the deposition materials as the reactant gas flows past the substrate. Rotation of the susceptor also produces an averaging of the temperature gradient which results in a significant reduction in the temperature differences both in the susceptor and in the substrate being supported thereon. While the rotatability of the susceptor will inherently improve the temperature characteristics in comparison to a fixed non-rotatable susceptor, the substrate supporting mechanism of the present invention is preferably configured to provide a sophisticated temperature sensing system which can be used to produce accurate temperature control in the vicinity of the susceptor. The temperature sensing system includes a first temperature sensor means which in the preferred embodiment, extends axially and upwardly through the axial driveshaft of the susceptor for sensing the temperature at the center of the susceptor. A fixed concentric ring is located in close surrounding relationship with the rotatable susceptor and at least one, and preferably more, additional temperature sensing means are providing at circumferentially spaced increments in the fixed ring, and these additional temperature sensing means will sense the temperatures at various points about the rotatable susceptor
|
| Related patents |
|
|
Optical system using a luminescent material sensor for measuring very high temperatures
Accordingly, these and other objects are accomplished by the various aspects of the present invention wherein, briefly, the temperature of a thermal radiating source is ...
|
|
|
Rotatable substrate supporting susceptor with temperature sensors
In accordance with the present invention, a new and useful rotatable substrate supporting mechanism is disclosed for use in single substrate chemical vapor deposition ...
|
|
|
Semiconductor wafer temperature measurement system and method
Other objects and advantages will be obvious, and will in part appear hereinafter and will be accomplished by the present invention which provides a method and apparatus ...
|
|
|
Techniques for measuring the thickness of a film formed on a substrate
These and other objects are accomplished by the various aspects of the present invention, wherein, briefly and generally, the thickness of a film is determined by ...
|
|
|
Rotatable substrate supporting mechanism with temperature sensing device for use in chemical vapor deposition equipment
In accordance with the present invention, a new and useful rotatable substrate supporting mechanism is disclosed for use in single substrate chemical vapor deposition ...
|
|
|
Sensor for semiconductor device manufacturing process control
The present invention accordingly provides an apparatus and method for non-invasive in-situ measurements of physical properties of metal and polycrystalline layers as ...
|
|
|
Semiconductor wafer temperature determination by optical measurement of wafer expansion in processing apparatus chamber
It is a primary objective of the present invention to provide a method and apparatus for instantaneously and accurately determining the temperature of thin plate-like ...
|
|
|
***WITHDRAWN PATENT AS PER THE LATEST USPTO WITHDRAWN LIST*** *** NO IMAGES AVAILABLE***
Description:...
|
|
|
Musical drum lighting apparatus
In view of the foregoing disadvantages inherent in the known types of musical lighting apparatus now present in the prior art, the present invention provides a musical ...
|
|
|
Light source system
What is claimed is: 1. A light source system comprising a concave reflecting mirror of semi-elliptical and cylindrical shape, a linear light emitter arranged at one ...
|
|
|