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 Method of visualizing minute particles

Details
Inventors: Goshorn, Lawrence A.; Trozzi, Thomas O.; Ayoub, George T.; Newberg, Nicholas A.;
Assignee: Machine Vision Products, Inc. (Carlsbad, CA)
Primary Examiner: Pham; Hoa Q.
Assistant Examiner:
Attorney, Agent or Firm: Kleinke; Bernard L.

The visualization method includes generating a relatively wide beam of light directed onto an object to be inspected and determining the center of intensity of the wide beam of light reflected from the object for facilitating geometric dimensional calculations of a large number of such objects, such as solder deposits on the surface of a printed circuit board, in a very short period of time and in a very accurate manner.

DETAILED DESCRIPTION What is claimed is: 1.
A method of determining the geometric dimension of a minute particle disposed on the top surface of a substrate, comprising: generating a plurality of coincident light beams arranged in a row; directing said plurality of coincident light beams toward the substrate and the minute particle; viewing said plurality of coincident light beams as they are reflected from the minute particle and the substrate; determining the gray scale intensity levels of each of the beams reflecting from the minute particle and substrate; determining a weighted average gray scale value of the plurality of reflected beams; calculating the center of intensity of the beams reflecting from the minute particle and the substrate; and determining a weighted average dimension of the minute particle based on the calculated center of intensity.
2.
A method according to claim 1, wherein the step of directing said plurality of coincident light beams includes the steps of: directing a set of forward laser beams toward the surface of the substrate; directing the set of forward laser beams rearwardly downwardly at an angle .
theta.
.
sub.
ss relative to the horizontal plane of the substrate; projecting a set of rear laser beams toward the surface of the substrate; and directing the set of rear laser beams forwardly downwardly at an angle .
theta.
.
sub.
SR relative to the horizontal plane of the substrate.
3.
A method according to claim 2, wherein .
theta.
.
sub.
SS is between about 1 degree and about 89 degrees.
4.
A method according to claim 3, wherein .
theta.
.
sub.
SS is between about 15 degrees and about 75 degrees.
5.
A method according to claim 4, wherein .
theta.
.
sub.
SS is about 60 degrees.
6.
A method according to claim 2, wherein .
theta.
.
sub.
SS is between about 180 degrees and about 0 degrees.
7.
A method of determining the geometric dimensions of a minute particle according to claim 1, wherein the step of viewing includes: forming an image of said plurality of coincident light beams; splitting the image of said beams into a pair of images; reflecting said pair of images to form a group of image segments; and developing a pixel image voltage in response to viewing in a predetermined order each segment, wherein each voltage developed is indicative of the gray scale intensity level of the corresponding beam reflecting from the minute particles and substrate



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