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 Microfabrication using germanium-based release masks

Details
Inventors: Clark, William A.;
Assignee: Analog Devices IMI, Inc. (Berkeley, CA)
Primary Examiner: Fourson; George
Assistant Examiner: Pham; Thanh V
Attorney, Agent or Firm: Vierra Magen Marcus Harmon & DeNiro LLP

A method of fabricating MicroElectroMechanical systems. The method includes: providing a substrate in which electrical interconnections and a sacrificial layer have been formed, forming a release mask including germanium, etching exposed sacrificial material, and removing the release mask. The performance of MicroElectroMechanical devices is improved by 1) integrating electronics on the same substrate as the mechanical elements, 2) increasing the proximity of electronics and mechanical elements, 3) increasing the undercut of a release etch to reduce or eliminate etch holes or to allow circuit elements to be undercut, 4) increasing the yield and reliability of the MEMS release processes. In addition to released mechanical structures, the invention also provides a means for forming circuits such as a bandgap reference as a released MEMS element. Forming a bandgap circuit as a released MEMS element may improve reference voltage performance by allowing resistive heating of the circuit region to a constant, elevated temperature independent of the substrate temperature.

DETAILED DESCRIPTION The invention is directed to a method of fabricating MEMS systems.
The method includes: providing a substrate in which integrated circuits and a sacrificial layer have been formed, forming a release mask including germanium, etching exposed sacrificial material, and removing the release mask.
The release mask provides protection for materials that may be adversely affected by the release etch.
The mask may be removed without affecting other materials.
This invention may potentially be used with a variety of MEMS processes, see for example: U.
S.
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60/127,973, Filed Apr.
6, 1999; U.
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09/322,381, filed May 28, 1999; Montague et al.
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5,798,283 issued Aug.
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5,576,250, issued Nov.
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Implementations of the invention may include the following.
Circuit elements may be formed in the substrate including active devices such as transistors.
Electrical interconnection may be formed among circuit elements and structural elements.
Electrical circuits and electrical interconnection may involve materials that may be adversely affected by a release etch.
The structural elements may comprise materials that are not adversely affected by a release etch.
The circuit and/or structural elements may be supported by or connected to sacrificial materials that may be removed by a release etch.
A temporary release mask may be deposited and defined to allow a release etch to remove sacrificial materials where desirable while leaving other materials undisturbed.
The temporary release mask may be removed using an etch process that will not damage materials used in the MEMS device including electrical circuits, interconnection, and structural elements



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