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 Photogate sensor with improved responsivity

Details
Inventors: Hosier, Paul A.; Tandon, Jagdish C.; Tewinkle, Scott L.;
Assignee: Xerox Corporation (Stamford, CT)
Primary Examiner: Whitehead, Jr.; Carl
Assistant Examiner: Fenty; Jesse A.
Attorney, Agent or Firm: Hutter; R.

A depleted-gate photosensor, or photogate, structure includes a polysilicon layer disposed over a silicon substrate. The polysilicon layer occupies only a portion of each exposure area of the substrate, and is preferably in the form of a ring around the exposure area. By having a portion of the exposure area not covered by the polysilicon, the blue-light-attenuation effects of a polysilicon layer are reduced.

DETAILED DESCRIPTION According to one aspect of the present invention, there is provided a depleted-gate photosensor, comprising a substrate comprising crystalline silicon, the substrate defining a main surface including an exposure area exposable to light.
An oxide layer is disposed adjacent the main surface of the substrate, the oxide layer defining a gap of non-oxide material in the main surface of the substrate, and including oxide immediately adjacent the gap within the exposure area.
A polysilicon layer is disposed on the main surface, the polysilicon layer substantially covering the gap and extending over a portion of the exposure area and over a portion of the oxide layer immediately outside the gap.



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