In-line wafer surface mapping |
| FIG. 2 is a plan view that illustrates an uneven substrate surface of an exemplary substrate. A... |
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Light reflecting micromachined cantilever |
| The present invention is directed to overcoming one or more of the problems set forth above. B... |
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Micro-electro mechanical device made from mono-crystalline silicon and method of manufacture therefore |
| It is therefore one object of the present invention to provide an improved micro-electro-mechanical ... |
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Mechanical landing pad formed on the underside of a MEMS device |
| Although the following detailed description contains many specifics for the purposes of ... |
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MEMS device and fabrication method thereof |
| In an effort to solve the above problems, it is a feature of an embodiment of the present invention ... |
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Differential interferometric light modulator and image display device |
| An aspect of the invention provides a novel light modulator, a scanner and projection optics as a ... |
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MEMS with flexible portions made of novel materials |
| Micromechanical Structure Fabrication: Processes for microfabricating a MEMS device such as a ... |
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Solid-state image pickup device and fabrication method thereof |
| An object of the present invention is to provide a solid-state image pickup device intended to ... |
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Optical component package |
| The invention is an optical package including an optical component assembly comprising a substrate ... |
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Semiconductor integrated circuit and method of making the same
| Details |
Inventors: Taguchi, Minoru; Mochizuki, Hiroshi;
Assignee: Kabushiki Kaisha Toshiba (Kawasaki, JP)
Primary Examiner: LaRoche; Eugene R.
Assistant Examiner: Nguyen; Viet Q.
Attorney, Agent or Firm: Finnegan, Henderson, Farabow, Garrett and Dunner
For providing a semiconductor integrated circuit device including CCD type, bipolar type and MOS type integrated circuits in only one chip, island-shaped epitaxial layers of opposite conductivity type are disposed in a semiconductor substrate of one conductivity type having a low impurity concentration. A field oxide layer is provided so as to surround a periphery of an exposed surface of each epitaxial layer. A buried layer of opposite conductivity type having a high impurity concentration is is interposed between the semiconductor substrate and each epitaxial layer in such a manner that at least one edge thereof terminates to the lower surfaace of the field oxide layer. The CCD type integrated circuit is provided in the semiconductor substrate, and the bipolar type and MOS type integrated circuits are arranged in the epitaxial layers. |
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DETAILED DESCRIPTION It is an object of the present invention to provide a semiconductor integrated circuit device in which CCD type, bipolar type, and MOS type integrated circuits are provided in one semiconductor chip to eliminate described disadvantages of the multi-chip techniques. It is another object of the present invention to provide a semiconductor integrated circuit device having an isolation structure suitable for forming CCD type, bipolar type, and MOS type integrated circuits in one semiconductor chip. It is still another object of the present invention to provide a method of making the above semiconductor integrated circuit device without using a complicated process. According to an aspect of the present invention, there is provided a semiconductor integrated circuit device which comprises island-shaped epitaxial layers of opposite conductivity type selectively provided in a major surface of a semiconductor substrate of one conductivity type having a low impurity concentration, a field insulating layer surrounding a periphery of an exposed surface of each of the epitaxial layers, and a buried layer of opposite conductivity type having a high impurity concentration, terminating to the field insulating layer and covering each epitaxial layer. The CCD type, bipolar type, and MOS type integrated circuits are arranged on a part of the major surface of the semiconductor substrate, each epitaxial layer, and another part of the major surface of the semiconductor substrate and/or another epitaxial layer, respectively. According to another aspect of the present invention, there is provided a method of making the semiconductor integrated circuit device according to a principle incorporated in the firstly referred aspect of the present invention.
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