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 Process for the preparation of an optical structure and optical structure obtained thereby

Details
Inventors: Rostaing, Jean-Christophe; Coeuret, Francois;
Assignee: L'Air Liquide, Societe Anonyme pour l'Etude et l'Exploitation des (Paris, FR)
Primary Examiner: Beck; Shrive
Assistant Examiner: Maiorana; David M.
Attorney, Agent or Firm: Browdy and Neimark

The invention concerns the preparation of an optical structure. On a polymeric substrate there is first provided a surface activation, and the deposit of a layer of SiO.sub.2, 2000 .ANG. thick after which there is a deposit of a plurality of functional layers and finally a deposit of SiO.sub.2, 3 microns thick followed by a deposit of Si.sub.3 N.sub.4 /SiO.sub.x N.sub.y 3 microns thick, the latter being produced under radio-frequency polarization. The thus obtained optical structure has properties of adhesiveness, resistance to abrasion and to thermal impacts.

DETAILED DESCRIPTION We claim: 1.
A process for producing an optical structure comprising a silicon-based coating on an optical polymeric substrate, comprising the following consecutive steps: (a) plasma-activating a surface of the substrate with plasma based upon a gaseous mixture containing argon to form an activated surface; (b) depositing a first layer of SiO.
sub.
2 onto the activated surface by a plasma enhanced chemical vapor deposition technique from silane and oxygen to form a first layer having a thickness of from about 2 to 5 microns; (c) coating said first layer by a plasma enhanced chemical vapor deposition technique while the substrate is subjected to radio-frequency biasing with a second layer formed of a silicon nitride.
2.
The process for producing an optical structure comprising a silicon-based coating on an optical polymeric substrate, comprising the following consecutive steps: (a) plasma-activating a surface of the substrate with a plasma based upon a gaseous mixture containing argon to form a plasma-activated surface; (b) depositing a first layer of SiO.
sub.
2 onto the activated surface by plasma enhanced chemical vapor deposition from silane and oxygen to form a first layer having a thickness of from 2 to 5 microns; (c) coating said first layer by plasma enhanced chemical vapor deposition with a second layer, said second layer comprising a complex having a composition intermediate between SiO.
sub.
2 and Si.
sub.
3 N.
sub.
4 with a minimum of Si--Si bonds while the substrate is subjected to radio-frequency biasing.
3.
The process according to claim 1 wherein the nitride compound of silicon contains silicon, hydrogen and nitrogen.
4.
The process according to claim 1 wherein said second layer has a thickness of from 2 to 50 microns.
5.
The process according to claim 1 further comprising depositing onto the activated surface a silicon-based under-layer by plasma enhanced chemical vapor deposition from silane.
6.
The process according to claim 2 further comprising depositing onto said activated surface a silicon-based under-layer by plasma enhanced vapor chemical vapor deposition from silane



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