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 Silicon-on-silicon hybrid wafer assembly

Details
Inventors: Henley, Francois J.; Cheung, Nathan W.;
Assignee: Silicon Genesis Corporation (Campbell, CA)
Primary Examiner: Jones; Deborah
Assistant Examiner: Stein; Stephen
Attorney, Agent or Firm: Townsend and Townsend and Crew LLP

A hybrid silicon-on-silicon substrate. A thin film (2101) of single-crystal silicon is bonded to a target wafer (46). A high-quality bond is formed between the thin film and the target wafer during a high-temperature annealing process. It is believed that the high-temperature annealing process forms covalent bonds between the layers at the interface (2305). The resulting hybrid wafer is suitable for use in integrated circuit manufacturing processes, similar to wafers with an epitaxial layer.

DETAILED DESCRIPTION According to the present invention, a technique for applying a thin film of silicon material to a target, or handle, wafer is provided.
This technique separates thin films of material from a donor substrate by implanting particles,such as hydrogen ions, into the donor substrate, and then separating a thin film of material above the layer of implanted particles.
The thin film can be bonded to a target wafer that provides mechanical support to form a hybrid substrate before or after separation.
In a specific embodiment, the present invention provides a process for forming a film of material from a donor substrate, typically a single crystal of silicon, using a controlled cleaving process.
That process includes a step of introducing energetic particles (e.
g.
, charged or neutral molecules, atoms, or electrons having sufficient kinetic energy) through a surface of a donor substrate to a selected depth underneath the surface, where the particles are at a relatively high concentration to define a thickness of donor substrate material (e.
g.
, thin film of detachable material) above the selected depth.
The surface of the donor wafer is then typically attached to a target wafer, that will provide mechanical support for the thin film using a low-temperature bonding process.
The target wafer can be a single crystal, polycrystalline, or amorphous, depending on the desired hybrid wafer characteristics.
Energy is applied to a selected region of the donor substrate material to initiate a controlled cleaving action in the donor substrate, whereupon the cleaving action is made using a propagating cleave front(s) to free the donor material from a remaining portion of the donor substrate.
The thin film is then permanently bonded to the target wafer, typically with a high-temperature annealing process.
In another embodiment, a layer of microbubbles is formed at a selected depth in the substrate.
The substrate is globally heated and pressure in the bubbles eventually shatters the substrate material generally in the plane of the microbubbles, separating a thin film of silicon from the substrate



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