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Cleaning apparatus for cleaning reverse surface of semiconductor wafer
| Details |
Inventors: Akimoto, Masami;
Assignee: Tokyo Electron Limited (Tokyo, JP); Tokyo Electron Kyushu Limited (Tosu, JP)
Primary Examiner: Moore; Chris K.
Assistant Examiner:
Attorney, Agent or Firm: Oblon, Spivak, McClelland, Maier & Neustadt
A cleaning apparatus for cleaning the reverse surface of a semiconductor wafer has a pair of holders for holding the wafer therebetween such that the wafer is kept substantially horizontal with the major surface directed upward. The holders can be moved close to each other and away from each other in the horizontal direction, and be moved in the vertical direction. A rotary brush is brought into contact with the reverse surface of the wafer held between the holders. The rotary brush can be rotated about its center, and be revolved substantially about the center of the wafer. The shaft of the brush is connected to a flexible pipe. Pure water as cleaning water and drying nitrogen gas of about 200.degree. C. are selectively supplied to the reverse surface of the wafer through the flexible pipe. Cleaning nitrogen gas as a barrier gas is supplied to the major surface of the wafer so as to prevent a contaminant from being scattered from the reverse surface and attached to the major surface. |
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DETAILED DESCRIPTION It is the object of the invention to provide a cleaning apparatus capable of cleaning the reverse surface of a semiconductor wafer without spinning the wafer. Here, the "reverse surface" is the surface opposite to the major surface on which semiconductor treatments are performed to form a major region of a semiconductor device or chip. Although the semiconductor treatments include coating, exposure, and development of a resist, forming of semiconductor films or oxide films, and etching, etc. , only the treatments to a resist will be referred to in the embodiments described hereinbelow. According to the present invention there is provided a cleaning apparatus for cleaning a reverse surface of a semiconductor wafer reverse to a major surface thereof to be subjected to semiconductor treatments, comprising: a pair of holders for holding the wafer therebetween such that the wafer is kept substantially horizontal with the major surface directed upward; holder driving means for moving the holders close to each other and away from each other in a horizontal direction; first supply means for supplying cleaning liquid to the reverse surface of the wafer held by the holders; washing means for removing, with the use of the cleaning liquid, a contaminant from the reverse surface of the wafer held by the holders; and second supply means for supplying a drying gas to the reverse surface of the wafer held by the holders. Additional objects and advantages of the invention will be set forth in the description which follows and in part will be obvious from the description, or may be learned by practice of the invention. The objects and advantages of the invention may be realized and obtained by means of the instrumentalities and combinations particularly pointed out in the appended claims.
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