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High stability interferometer for measuring small changes in refractive index and measuring method using the interferometer
| Details |
Inventors: Barnes, Thomas H.; Matsuda, Kiyofumi; Ooyama, Naotake;
Assignee: Agency of Industrial Science and Technology (Tokyo, JP); Ministry of International Trade and Industry (Tokyo, JP)
Primary Examiner: Turner; Samuel
Assistant Examiner: Kurtz,II; Richard E.
Attorney, Agent or Firm: Oblon, Spivak, McClelland, Maier & Neustadt
A high stability interferometer is capable of continuous measurement of small changes in the refractive index of a sample. The interferometer has a diffraction grating placed to be movable sideways or radially, and diffract laser light into beams which include +1, -1 and zero order beams. The diffraction grating is in the input plane of a Fourier Transform lens. The beams are brought to a focus in the output plane of the lens and are reflected back towards the lens by a mirror placed in the transform plane of the lens. The sample whose refractive index is to be measured is placed in the path of the +1 or -1 order beam, between the diffraction grating and the mirror. |
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DETAILED DESCRIPTION An object of this invention is therefore to provide a high stability interferometer which is capable of measuring changes in refractive index as small as 10.
sup.
-7 or less, continuously and automatically and a method for measuring the same using the interferometer.
To attain the above object, this invention provides a high stability interferometer for measuring small changes in refractive index comprising a light source which produces spatially coherent light; a movably-supported diffraction grating placed in the path of the light from the light source for producing from the light passing therethrough diffracted beams which include +1, -1 and zero order diffracted beams; the diffraction grating being placed in the input plane of a Fourier Transform lens through which at least the +1, -1 and zero order beams pass and are brought to a focus at the Fourier Transform output plane of the lens; a mirror placed in the Fourier Transform plane for reflecting back toward the diffraction grating the +1, -1 and zero order beams that have passed through the Fourier Transform lens; a spatial filter placed in front of the reflecting surface of the mirror for isolating the +1, -1 and zero order diffracted beams; wherein a sample whose refractive index is to be measured is placed in the path of the +1 order diffracted beam or - 1 order diffracted beam between the diffraction grating and the mirror.
Light from the laser light source passes through a beam splitter to the diffraction grating which outputs various diffracted beams including +1, -1 and zero order diffracted beams.
The spatial filter isolates +1, -1 and zero order beams from the diffracted light.
The mirror reflects these three beams back to the diffraction grating, where they are recombined.
At this time the sample is placed so that it intercepts the +1 or -1 diffracted beams.
The light thus recombined is again diffracted by the diffraction grating into +1 and -1 order diffracted light beams which are detected by photodetectors
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Nonmetallic Processes 
