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 Method for manufacturing a semiconductor device

Details
Inventors: Nagakubo, Yoshihide;
Assignee: Tokyo Shibaura Denki Kabushiki Kaisha (Kawasaki, JP)
Primary Examiner:
Assistant Examiner:
Attorney, Agent or Firm:

The invention provides a method for manufacturing a semiconductor device, having the steps of: forming a first mask member which has an opening to expose a desired portion of one major surface of a semiconductor substrate; doping an impurity which has the same conductivity type as that of the semiconductor substrate through the opening of the first mask member to form an impurity region of a high concentration in the surface layer of the semiconductor substrate; forming a second mask member on the side surface of the opening of the first mask member while the first mask member is left as it is; forming a groove by selectively etching the semiconductor substrate using the first and second mask members, and at the same time leaving an impurity region of the high concentration at least on the side surface of the groove; and burying an insulating isolation material in the groove.

DETAILED DESCRIPTION It is an object of the present invention to provide a method for manufacturing a semiconductor device, wherein channel-cut regions are readily and uniformly formed respectively on the side surfaces of an element region extending above any other surface portions of a semiconductor substrate.
According to an embodiment of the present invention, there is provided a method for manufacturing a semiconductor device, comprising the steps of: forming a first mask member which has an opening to expose a desired portion of one major surface of a semiconductor substrate; doping an impurity which has the same conductivity type as a conductivity type of said semiconductor substrate through said opening of said first mask member to form an impurity region of a high concentration in a surface layer of said semiconductor substrate; forming a second mask member on a side surface of said opening of said first mask member while said first mask member is left as it is; forming a groove by selectively etching said semiconductor substrate using said first and second mask members, and at the same time leaving an impurity region of the high concentration at least on a side surface of said groove; and burying an insulating isolation material in said groove.
According to another embodiment of the present invention, there is also provided a method for manufacturing a semiconductor device, comprising the steps of: forming a first mask member which has an opening to expose a desired portion of one major surface of a semiconductor substrate; forming a second mask member on a side surface of said opening; forming a groove by selectively etching said semiconductor substrate using said first and second mask members; removing said second mask member; doping an impurity which has the same conductivity type as a conductivity type of said semiconductor substrate through said opening of said first mask member to form an impurity region of a high concentration at least on a side surface of said groove; and burying an insulating isolation material in said groove



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