Wafer transfer system |
| What is claimed is: 1. In a wafer transfer system including automatic robot claws and a susceptor ... |
|
Mail tracker with zip break marker |
| OF THE INVENTION FIG. 1 is a generalized diagrammatic illustration of a specific embodiment of a ... |
|
Volumetric fluid dispensing apparatus and method |
| OF THE INVENTION Referring now to the drawings, and more particularly to FIG. 1, the dispensing ... |
|
Process chamber purge module for semiconductor processing equipment |
| The system and method of the present invention provide inventive subject matter to overcome the ... |
|
Resist developing apparatus |
| The object of the present invention is to provide a resist developing apparatus which permits ... |
|
System and method for applying a liquid |
| It is accordingly an object of the present invention to provide a system and a method for applying ... |
|
Photographic coupler compositions containing ballasted alcohols and methods |
| The photographic coupler compositions of the present invention comprise a dye-forming coupler, ... |
|
Device for cleaning, testing and sorting of workpieces |
| I claim: 1. Device for treating by cleaning, testing and sorting substrates comprising: at least ... |
|
Device and method for scrubbing and cleaning substrate |
| An object of the present invention is therefore to provide a scrubbing and cleaning device, more ... |
|
Cleaning apparatus for cleaning reverse surface of semiconductor wafer |
| It is the object of the invention to provide a cleaning apparatus capable of cleaning the reverse ... |
|
|
System for configuring, automating and controlling the test and repair of printed circuit boards
| Details |
Inventors: Babcock, Douglas M.;
Assignee: CIMM, Inc. (Troy, NY)
Primary Examiner: Arbes; Carl J.
Assistant Examiner:
Attorney, Agent or Firm: Heslin & Rothenberg
A method and apparatus for configuring, automating and controlling the testing and/or repair of printed circuit boards is presented. The apparatus includes one or more test and/or repair stations and conveyor units to transport PCB's and other components required to test and/or repair such printed circuit boards between such stations. The printed circuit boards are mounted in standardized carriers which facilitate intermixing different sizes and shapes of boards without requiring adjustment of the conveyor units. The other components such as the fixture assemblies required to electrically access the printed circuit boards are adapted to also be transportable by the same conveyor units. The apparatus further includes an automation interface to efficiently and accurately load and unload the PCB's and other required components to and from stages of certain stations, buffering stages associated with each station for temporarily storing PCB's and other components, and a distributed control system to facilitate the parallel processing of different types of PCB's in accordance with a dynamic priority rating system and a preemptive scheduling technique. |
|
DETAILED DESCRIPTION OF THE INVENTION A perspective view illustrating various functional modules of the test system 10 according to the present invention is provided in FIG. 1. Depending upon the complexity and type of circuit or PCB being tested it may be necessary to use multiple test stages. It may also be necessary to use various combinations of test stages in different sequences to reliably locate the faults which might be present therein. As can be seen, the system 10 can include such multiple test stages, for example, stages 11a and 11b. The test stages 11 can be identical, or they can be of different types, e. g. functional, in-circuit, combinational, special device or component testers, bare board testers, etc. Such testors and the computer controllers employed operate them are commercially available and therefor are not described in detail herein. Although FIG. 1 illustrates two test stages 11, the present invention is not intended to be limited to this number nor to the descriptions provided above. Conveyor means are provided to load and unload such PCBs and other transportable components from the test and/or repair stages and to transport such components there between. The conveyor means of the present invention employs plug together, modular conveyor units which are specifically adapted to afford flexibility in the configuration of the test system 10. Conveyor unit 12 is a linear conveyor which moves components in two directions, i. e. , towards as well as away from a stage. It should be noted that such forwards and backwards motion is not commonly found in typical automated production lines which generally transport the items under process in one common direction. A more complex motion is however required to enable conveyor unit 12 to be utilized to transport components both into as well as out of a test stage 11, as is included in the present invention. To afford an even more flexible test and repair system, a conveyor unit 13 is provided incorporating the capability for the rotational movement of the components in addition to linear movement
|
| Related patents |
|
|
Apparatus for transferring long stock between positions associated with storage and processing stations
. FIG. 1 shows two storage racks 1 having storage shelves or compartments 2 protruding from both sides of the rack 1 to hold long stock 3. "Long stock", as used herein, ...
|
|
|
Conveyor means for wafers
The present invention is a simple means of conveying wafers one by one both stably and free from generation of dust. This conveyor means can safely be used in a clean ...
|
|
|
Pressurized injection nozzle for screening paste
It is therefore an object of the present invention to provide an improved method of applying bonding agents, such as solder pastes and conductive adhesives, to chip on a ...
|
|
|
Apparatus for testing integrated circuits
p Accordingly, the present invention overcomes these and other disadvantages by providing apparatus for statically and dynamically testing an integrated circuit die in ...
|
|
|
Handler used in testing system for semiconductor devices
What is claimed is: 1. A handler for supplying a semiconductor device to a test head which is separated from said handler and used to measure an electrical ...
|
|
|
Wafer boat for vertical diffusion and vapor growth furnace
An object of the invention, therefore, is to overcome the problems existing in the prior art, and to provide a wafer boat for a vertical furnace that can reduce stress ...
|
|
|
Apparatus for transporting a wafer and a carrier used for the same
An object of the present invention is to provide a wafer transporting apparatus which is capable of simplifying a wafer transporting mechanism. Another object of the ...
|
|
|
Semiconductor object pre-aligning method
The present invention includes a prealignment apparatus for semiconductor objects which minimizes or obviates the above problems. For one thing, the object engagement ...
|
|
|
Fusion seal and sealing mixtures
My invention resides in part in a fusion seal between the surfaces of two bodies, the fusion seal consisting essentially by weight of 60-90% of a SnO--ZnO--P.sub.2 O.sub....
|
|
|
***WITHDRAWN PATENT AS PER THE LATEST USPTO WITHDRAWN LIST*** *** NO IMAGES AVAILABLE***
Description:...
|
|
|