Reducing charging effects in charged-particle-beam lithography
A charge-conducting film made in accordance with the principles of the present invention is advantageously deposited on the surface of a workpiece in a conventional radial-flow plasma reactor. A simp... Read More
Inventors: Adams, Arthur C.; Alexander, Jr., Frank B.; Levinstein, Hyman J.; Thibault, Louis R.;, Assignee: Bell Telephone Laboratories, Incorporated (Murray Hill, NJ) |
Process for preparing arsenic-selenium photoreceptors
OF THE INVENTION A cascaded crucible thermal heating control system was developed employing dual crucible temperature and arsenic-selenium alloy evaporation rate sensors to process crucible power inp... Read More
Inventors: Hordon, Monroe J.; Gerace, Robert E.;, Assignee: Xerox Corporation (Stamford, CT) |
Photometric measuring system
What is claimed is: 1. An absorption photometric measurement system comprising, a light source for projecting light onto a liquid sample under test, a photodiode disposed in light interrupting positio... Read More
Inventors: Freeman, Gary M.;, Assignee: Gilford Instrument Laboratories, Inc. (Oberlin, OH) |
Method and apparatus for determining object position and dimension using a diffraction wave
FIG. 1 illustrates a basic system used for determining part sizes in a manner similar to that discussed in my application No. 253,421 to which this application is a continuation-in-part. Cylindrical ... Read More
Inventors: Pryor, Timothy R.;, Assignee: |
Roll gap measuring device for continuous casting machine
In view of the above facts, one object of the present invention is to provide a roll gap measuring device for a continuous casting machine, capable of accurately measuring the gap between rolls in a s... Read More
Inventors: Oda, Kenichi;, Assignee: Kawasaki Steel Corporation (Hyogo, JP) |
Method and apparatus for measuring roll gap and alignment for continuous casters
A main object of this invention is to provide an improved method and apparatus for measuring conveyor roll position so as to better determine conveyor roll profile. Another object of this invention is... Read More
Inventors: Kihlstrom, Ernest H.;, Assignee: Bethlehem Steel Corporation (Bethlehem, PA) |
Arrangement for measuring two oppositely arranged rollerways of a continuous casting plant
This object is achieved according to the invention in that at least on one of the spring strips a distance-alteration measuring means is provided, substantially extending in the moving direction of th... Read More
Inventors: Scheinecker, Alois;, Assignee: Voest-Alpine Aktiengesellschaft (Linz, AT) |
Method of and apparatus for measuring dampening water for printing machine
Accordingly, an object of the invention is to provide a method of and apparatus for measuring the dampening water for printing machine, making use of the light reflected from the plate surface, improv... Read More
Inventors: Aoki, Kenichi; Ohta, Asaya;, Assignee: Sumitomo Heavy Industries, Ltd. (Tokyo, JP) |
Method and apparatus for determining the distance of an object
We claim: 1. A method to determine the position, velocity and orientation of an object with respect to an observation point, comprising the steps of: (a) emitting at least two non-parallel incident be... Read More
Inventors: Franklin, Douglas E.; Frank, Gordon I.; Palylyk, Richard A.; Toom, Paul O.;, Assignee: B. C. Hydro (Vancouver, CA) |
Gap measuring apparatus
I claim: 1. A hand held optical probe axially insertable into the fastener holes of a plurality of layers of panels for measuring the gap between adjacent panels, the combination comprising: a rigid h... Read More
Inventors: Boshier, Geoffrey;, Assignee: Textron Inc. (Providence, RI) |
Method and apparatus for real-time, in-situ endpoint detection and closed loop etch process control
An object of the present invention is to provide a method and apparatus for overcoming the problems in the art discussed above. Another object of the present invention is to provide a method and appar... Read More
Inventors: Barbee, Steven G.; Heinz, Tony F.; Hofer, Ulrich; Li, Leping; Silvestri, Victor J.;, Assignee: International Business Machines Corporation (Armonk, NY) |
Apparatus for producing thin film
In consideration of the above problems of the prior art, an object of the present invention is to provide a method and an apparatus for producing a thin film which are capable of forming a thin film b... Read More
Inventors: Matsuno, Akira; Nire, Takashi;, Assignee: Kabushiki Kaisha Komatsu Seisakusho (Tokyo, JP) |
Die transfer structure and method
In accordance with the invention, there is provided a structure for and method of facilitating transferring a die onto or off of a bolster plate on the press or the like, and/or onto and off of a die ... Read More
Inventors: Brown, Donald H.;, Assignee: |
Method for surfacing a wood panel with a plastic film
What is claimed is: 1. A method for surfacing a wood panel with a plastic film comprising the steps of: (A) sanding one surface of the wood panel to provide a smooth surface for prefinishing; (B) appl... Read More
Inventors: Fogle, Ozzie; Cooley, James;, Assignee: Champion International Corporation (Stamford, CT) |
Irradiation of polyacrylate films in air
OF THE INVENTION The heterocyclic polyacrylate materials useful in the practice of the process of the present inventions include both novel compounds and known compounds not heretofore known to be ox... Read More
Inventors: Wendling, Larry A.; Covington, John B.;, Assignee: Minnesota Mining and Manufacturing Company (St. Paul, MN) |
Process of making information carrying systems
OF THE INVENTION Polymerizable compositions are applied to the surface of a substrate by a screen printing process. The polymerizable composition passes through the mesh of a screen and is deposited ... Read More
Inventors: Daniels, Michael P.; Schoonover, Robert J.;, Assignee: Minnesota Mining and Manufacturing Company (St. Paul, MN) |
Spin-on dopant method
What is claimed is: 1. A single furnace method for boron dopant deposition and diffusion of a p-type semiconductor substrates comprising: (a) applying a dopant layer to said semiconductor substrate fr... Read More
Inventors: Justice, Bruce H.; Aycock, Robert F.;, Assignee: Allied Corporation (Morris Township, Morris County, NJ) |
Repositionable substrate for microscopes
Accordingly, it is an object of this invention to make an improved repositionable substrate for scanning probe microscope applications. It is a further object of this invention to make a repositionabl... Read More
Inventors: Turner, David C.; Gaber, Bruce P.;, Assignee: The United States of America as represented by the Secretary of the Navy (Washington, DC) |
Method and apparatus for in situ removal of contaminants from ion beam neutralization and implantation apparatuses
OF PREFERRED EMBODIMENTS Operation of Implanter Turning now to the drawings, FIG. 1 depicts an ion beam implanter shown generally at 10, which includes an ion source 12, apparatus shown generally at ... Read More
Inventors: Blake, Julian G.;, Assignee: Eaton Corporation (Cleveland, OH) |
Film-type evaporator
The aim of the invention is to provide a small evaporator which has a high thickening capacity and treats the product in a careful manner. According to the present invention a film-type evaporator is ... Read More
Inventors: Feres, Vaclav;, Assignee: |
Method of making a shearfoil for dry shavers
What is claimed as new and desired to be protected by Letters Patent is set forth in the appended claims. 1. In a method of making a dry shaver shearfoil capable of erecting the beard hair of a user, ... Read More
Inventors: Wich, Robert;, Assignee: Braun AG (Frankfurt am Main, DE) |
Plasma display panel and the fabrication method thereof
It is an object of the present invention to provide a plasma display panel that is strong in structure and has a cathode of a low line resistance and high strength. Also, it is another object of the p... Read More
Inventors: Lee, Seung-woo; Kang, Ji-hyun;, Assignee: Samsung Electronics Co., Ltd. (Suwon, KR) |
Dopant film and methods of diffusing impurity into and manufacturing a semiconductor wafer
It is accordingly an object of the present invention to provide a dopant film which is suitable for automated alternate stacking with semiconductor wafers and hence labor saving, and can enhance the u... Read More
Inventors: Iwabuchi, Masaburo; Ito, Hideyoshi; Unetsubo, Kenji;, Assignee: Kabushiki Kaisha Toshiba (Kawasaki, JP) |
Circularly symmetric, large-area, high-deposition-rate sputtering apparatus for the coating of disk substrates
OF THE INVENTION Reference will now be made in detail to the preferred embodiments of the invention, examples of which are illustrated in the accompanying drawings. While the invention will be descri... Read More
Inventors: Nelson, Carl W.; Weir, Richard D.;, Assignee: Tulip Memory Systems, Inc. (Fremont, CA) |
***WITHDRAWN PATENT AS PER THE LATEST USPTO WITHDRAWN LIST*** *** NO IMAGES AVAILABLE***
Description:... Read More
Inventors: , Assignee: |
Fine-line circuit fabrication and photoresist application therefor
OF THE PREFERRED EMBODIMENT Referring to FIG. 1, FIG. 1a depicts a substrate 2, upon which conductive lines are to be deposited. In an application where the conductive lines are to be used for the in... Read More
Inventors: Castellani, Eugene E.; Croll, Ian M.; Pfeiffer, Aloysius T.; Romankiw, Lubomyr T.;, Assignee: International Business Machines Corporation (Armonk, NY) |
Method of forming pattern and projection aligner for carrying out the same
An object of the present invention is to provide a pattern forming method which can solve the above-mentioned problems of the prior art and can form a fine pattern accurately on a substrate surface ha... Read More
Inventors: Fukuda, Hiroshi; Hasegawa, Norio; Tanaka, Toshihiko; Kurosaki, Toshiei;, Assignee: Hitachi, Ltd. (Tokyo, JP) |
Optical FM characteristics measurement apparatus for laser diode
It is, therefore, an object of the present invention to provide an optical FM characteristics measurement apparatus in which the discriminating point of the Mach-Zehnder interferometer can be determin... Read More
Inventors: Mori, Hiroshi; Kimura, Eiji;, Assignee: Advantest Corporation (Tokyo, JP) |
Surface modification of fluoropolymers by reactive gas plasmas
OF THE INVENTION The reactive gas plasma surface modification method of the instant invention produces a bondable fluoropolymer surface that has improved properties, in particular they are highly adh... Read More
Inventors: Prohaska, George W.; Butler, Richard J.; Nickoson, Carl G.;, Assignee: The Standard Oil Company (Cleveland, OH) |
Modification of polymer surfaces
I claim: 1. A process for modifying polymer surfaces, comprising, exposing an organic modifier to actinic radiation while a polymer surface is in contact with said organic modifier, provided that the ... Read More
Inventors: Allmer, Klas G. M.;, Assignee: E. I. Du Pont de Nemours and Company (Wilmington, DE) |
Nonmetallic Processes 
