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Optical Systems

Beam-scanning-apparatus

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Beam scanning apparatus

Details

Inventors: Eum, Jae-yong; Lee, Wong-hyung; Cho, Sung-min;
Assignee: Samsung Electronics Co., Ltd. (Kyungki-Do, KR)
Primary Examiner: Spyrou; Cassandra
Assistant Examiner: Curtis; Craig
Attorney, Agent or Firm: Sughrue, Mion, Zinn, Macpeak, PLLC

A beam scanning apparatus includes an optical source, a beam deflector having a deflection disk which is comprised of a plurality of sectors patterned to diffract a beam emitted from the optical source and has a reflective layer for reflecting an incident beam formed on the bottom surface of the beam deflector, and a driving source for rotating the deflection disk. A beam corrector is provided for correcting the beam deflected by the beam deflector.

DETAILED DESCRIPTION To solve the above problems, it is an object of the present invention to provide a compact beam scanning apparatus adopting a deflection disk instead of a rotating polygonal mirror.
Accordingly, to achieve the above object, there is provided a beam scanning apparatus comprising: an optical source for emitting a beam of light; a beam deflector having a deflection disk which includes a plurality of sectors patterned to diffract the beam emitted from the optical source and a reflective layer for reflecting an incident beam and which is formed on a bottom surface of the beam deflector, and a driving source for rotating the deflection disk; and a beam corrector which corrects the beam deflected by the beam deflector.
Each sector of the deflection disk has an incident region for receiving the beam emitted from the optical source and an emission region for emitting the beam reflected by the reflective layer, and the pattern is formed in at least one region of the incident and emission regions.
Also, it is preferable that the patterns formed in the incident region and emission region are different.

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