Home | Links | Contact Us | More About Intellectual Property | Bookmark
Search patents:
Home Quantum Computing Method-of-manufacturing-semiconductor-device

 Photoelectrochemical processing of III-V semiconductors
The invention is a process for making a semiconductor device in which intrinsic compound ...


 Light power controlling apparatus
Accordingly, an object of the present invention is to provide a light power controlling apparatus ...


 Gas discharge structure for an R.F. excited gas laser
I claim: 1. A gas discharge structure for an R.F. discharge excited gas laser comprising: an R.F. ...


 Money buckle
In accordance with this invention, a money buckle is provided for secretly carrying valuables and ...


 Tile cutter
What is claimed is: 1. A tile cutter for cutting tile placed thereon, comprising: a base; a guide ...


 Tape dispenser with blade guard
OF THE INVENTION Referring now to the accompanying drawing wherein like reference numerals appear ...


 Device for monitoring yarn motion on a textile machine
It is a primary objective of the invention to provide a sensing device for monitoring ballooning ...


 Semiconductor scribing method
The present invention contemplates the scribing and breaking of a semiconductor wafer into ...


 Etch method of cleaving semiconductor diode laser wafers
OF THE INVENTION The description that follows is given generally in terms of double ...


 Method for controlling fuel injector lift
FIG. 1 is an example of a top feed fuel injector 10 utilizing the spacer 12 of the present ...


 Method of manufacturing semiconductor device

Details
Inventors: Mochizuki, Chiori;
Assignee: Canon Kabushiki Kaisha (Tokyo, JP)
Primary Examiner: Hearn; Brian E.
Assistant Examiner: Nguyen; Tuan
Attorney, Agent or Firm: Fitzpatrick, Cella, Harper & Scinto

A method of manufacturing a semiconductor device having a photoconductive semiconductor layer formed on a substrate and a pair of electrodes formed on the semiconductor layer with an ohmic contact layer interposed therebetween, wherein the ohmic contact layer is removed after the etching process of the semiconductor layer.

DETAILED DESCRIPTION It is an object of the present invention to provide a method of manufacturing a semiconductor device having a photoconductive semiconductor layer formed on a substrate and a pair of electrodes formed on the semiconductor layer with an ohmic contact layer interposed therebetween, wherein the ohmic contact layer is removed after the etching process of the semiconductor layer.
It is another object of the present invention to provide a method of patterning an n.
sup.
+ layer capable of satisfying the design values, by changing the order of the n.
sup.
+ etching process and the isolation process.
It is a further object of the present invention to provide a photoelectric conversion device manufactured by the above method which can provide a uniform characteristic of each element and a large S/N ratio.



Related patents
  Integrated capacitor and method of fabricating same
It is, therefore, an object of the present invention to provide a method of fabricating an integrated capacitor having an extremely thin dielectric or insulating layer. A...
  MOS capacitor for improving electrostatic durability by using of a transistor
An object of the present invention is to improve electrostatic durability by forming an electrostatic discharge path. In order to achieve this object, a MOS capacitor ...
  Method for simultaneously forming capacitor plate and metal contact structures for a high density DRAM device
It is an object of this invention to create a DRAM device, comprised of a stacked capacitor, (STC), structure, and metal contact structures. It is another object of this ...
  Method of making a reverse self-aligned BIMOS transistor integrated circuit
What is claimed is: 1. The method of forming self-aligned field effect and bipolar transistors comprising: forming a heavily doped conductive layer of one conductivity ...
  Method for fabricating VDMOS transistor with improved breakdown characteristics
What is claimed is: 1. A method for fabricating vertical-current-flow field-effect transistors, comprising the steps of: (a.) providing a substrate which includes at ...
  Advanced titanium silicide process for very narrow polysilicon lines
It is an object of this invention to form a low resistance, titanium silicide layer, for use as a component for narrow, less than 0.20 micrometer width, polycide word ...
  Method for fabricating a on-chip temperature controller by co-implant polysilicon resistor
It is an object of the present invention to provide a method for fabricating a resistor in an on-chip temperature sensor that has an easily controllable cut off ...
  Electrophoretic system and method for multidimensional analysis
Having thus described the invention, there is claimed as new and desired to be secured by Letters Patent: 1. An apparatus for conducting electrophoretic analysis, the ...
  Method for forming ultra fine deep dielectric isolation
In accordance with the present invention, a method is described for the formation of ultra fine grooves that can be filled with dielectric material which can then act as ...
  Reactive ion etching of III-V compounds including InP, GaAs-InP and GaAlAs
The following describes, in accordance with the present invention, a process for reactive ion etching of GaAs, InP and their derivative ternary and quartenary compounds,...

0.014

Archive: All patents - Links

Copyright (c)2006 Eipa-patents.org - All rights reserved