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Separation of thin films from transparent substrates by selective optical processing
| Details |
Inventors: Cheung, Nathan W.; Sands, Timothy D.; Wong, William S.;
Assignee: The Regents of the University of California (Oakland, CA)
Primary Examiner: Mulpuri; Sanitri
Assistant Examiner:
Attorney, Agent or Firm: Pennie & Edmonds LLP
A method of separating a thin film of GaN epitaxially grown on a sapphire substrate. The thin film is bonded to an acceptor substrate, and the sapphire substrate is laser irradiated with a scanned beam at a wavelength at which sapphire is transparent but the GaN is strongly absorbing, e.g., 248 nm. After the laser irradiation, the sample is heated above the melting point of gallium, i.e., above 30.degree. C., and the acceptor substrate and attached GaN thin film are removed from the sapphire growth substrate. If the acceptor substrate is flexible, the GaN thin film can be scribed along cleavage planes of the GaN, and, when the flexible substrate is bent, the GaN film cleaves on those planes. Thereby, GaN lasers and other electronic and opto-electronic devices can be formed. |
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DETAILED DESCRIPTION The invention may be summarized as a method of transferring a crystalline film from a growth substrate to an acceptor substrate. The film of one composition is grown on a substrate of another composition having an absorption edge at a shorter wavelength than that of the grown film. The film side of the structure is then bonded to an acceptor substrate. A strong optical beam irradiates the side of the structure having the growth substrate with radiation that passes through the growth substrate but which is strongly absorbed in the film, thereby weakening the interfacial bond due to localized decomposition of the film at the interface. The intensity of the radiation is, however, low enough to not cause the irradiated area to separate. Preferably, the laser is raster scanned over an area larger than that of the laser beam. A separation process is performed after the completion of the laser irradiation. In the example of a GaN thin film, the separation process may include heating the structure to above the melting point of gallium, which is 30. degree. C. Chemical separation processes may also be used. Alternatively, a sacrificial layer may be grown between the desired film and the growth substrate. The optical beam absorbed by the sacrificial layer can then irradiate from the side of either the growth or acceptor substrate that is transparent to the optical beam. The acceptor substrate may be flexible, for example, an elastomeric substrate. In this case, the film may be laser scribed along cleavage planes, and then the flexible substrate is bent to cleave the film at desired facets.
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