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 SiC/111-V-nitride heterostructures on SiC/SiO.sub.2 /Si for optoelectronic devices

Details
Inventors: Soref, Richard A.; Namavar, Fereydoon;
Assignee: The United States of America as represented by the Secretary of the Air (Washington, DC)
Primary Examiner: Jackson, Jr.; Jerome
Assistant Examiner:
Attorney, Agent or Firm: Nathans; Robert L.

A low-cost Si-based construction for optical and electronic bulk-heterostructure devices and multiple-quantum-well devices in which the active layers of the device are SiC or AlGaN or InGaN or InAlN. Material quality is high, and the MQW devices such as blue light lasers or LEDs have stable pseudomorphic layers with low defect densities. The low-cost large-area 3C SiC substrate is created by converting 100% of a 100-500 angstrom (.ANG.) layer of Si in a silicon-on-insulator wafer to 3C SiC with propane at 1300 degrees C. The SiO2 layer provides strain-free support for the "perfect" 3C SiC crystal layer. Direct-gap wurtzite nitride heterostructures, bulk or pseudomorphic MQW, are grown upon an (0001) 6H SiC epilayer on the (111) 3C SIC substrate, or directly upon the (111) 3C SiC substrate. For zincblende heterostructures, a (100) 3C SiC substrate is used.

DETAILED DESCRIPTION These problems and needs will be met in accordance with a preferred embodiment of the invention by converting 100% of a 100-500 .
ANG.
layer of Si of a silicon-on-insulator wafer to 3C SiC with propane at about 1300 degrees C.
The SiO.
sub.
2 layer provides strain-free support for the resulting "perfect" 3C SiC crystal layer.
Direct-gap wurtzite nitride heterostructures, bulk or pseudomorphic MQW, are grown upon an (0001) 6H SiC epilayer on the (111) 3C SIC substrate.
For zincblende heterostructures, a (100) 3C SiC substrate is used.
Thus the resulting novel electro-optic component has a silicon carbide-on-insulator substrate (SiCOI) unit having an upper silicon carbide crystalline layer of a thickness of about 500 angstroms or less and a heterostructure epitaxially formed upon the upper silicon carbide crystalline layer of the SiCOI substrate unit, which could be zincblende bulk heterostructures, Wurtzite-bulk heterostructures, zincblend heterostructures having a pseudomorphic stack of multiple quantum wells, and Wurtzite heterostructures having a pseudomorphic stack of multiple quantum wells.



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