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Adaptive-control-of-the-detection-threshold-of-a-binary-integrator

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Adaptive control of the detection threshold of a binary integrator

Details

Inventors: Frey, Jr., Thomas Lawrence;
Assignee: Lockheed Martin Corporation (Bethesda, MD)
Primary Examiner: Gregory; Bernarr E.
Assistant Examiner:
Attorney, Agent or Firm: Jackson Walker LLP

The present invention provide a method and system of dynamically estimating a coefficient of variation of the fluctuation of a waveform and an optimal binary detection threshold using the estimated coefficient of variation. The system discriminates between noise signals and signal-plus-noise signals of a digitized signal by comparison with a threshold. The noise and signal-plus-noise signals are further used to determine a mean noise floor level and a standard deviation, respectively. Subsequently, the system determines the coefficient of variation based on the ratio of standard deviation to mean. The optimal binary detection threshold is calculated using the coefficient of variation, presets for cumulative probability of false alarm and collection time.

DETAILED DESCRIPTION The present invention achieves technical advantages as an apparatus, method and system of dynamically estimating a coefficient of variation of the fluctuation of a waveform and an optimal binary detection threshold using the estimated coefficient of variation.
Initially, an A/D converter receives an analog waveform signal and converts the signal to digital form, which is fed to a hard thresholding unit.
The hard thresholding unit discriminates between a noise signal and a signal-plus-noise signal by comparison with a threshold in which the noise signal is used to estimate a mean noise floor level and the signal-plus-noise is used to estimate a standard deviation.
The hard thresholding unit further determines the coefficient of variation based on the ratio of standard deviation to mean.
An optimal threshold estimator uses the estimated coefficient of variation, presets for cumulative probability of false alarm and collection time to determine the optimal binary detection threshold.

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