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 Averaging flash analog-to-digital converter

Details
Inventors: Dingwall, Andrew G. F.; Hsueh, Fu-Lung;
Assignee: David Sarnoff Research Center Inc. (Princeton, NJ); Industrial Technology Research Institute (CN); Electronics Research & Service Org. (CN)
Primary Examiner: Williams; Howard L.
Assistant Examiner:
Attorney, Agent or Firm: Burke; William J.

A flash-type analog-to-digital converter (ADC) uses only 2.sup.n-m comparators coupled to the analog input line to generate a n-bit digital output signal. Each pair of these actual comparators are coupled, in parallel, to 2.sup.m pseudocomparators which provide values representing comparisons of the input signal value to respective reference values between the reference values used by the actual comparators. The output signals of each pair of actual comparators are combined in respectively different proportions at each of the pseudocomparators. In this manner, the output signals of the actual comparators are averaged to produce the interstitial comparison values. In one embodiment of the invention, the ADC is implemented in BiCMOS technology with a bipolar differential input stage and a CMOS latching comparator. Signals are distributed from the actual comparators to the pseudocomparators via a pair of resistive ladder networks. In other embodiments of the invention the ADC is implemented in CMOS technology and the pseudocomparators use ratioed transistor widths and ratioed capacitors to proportionally divide the output signals of the actual comparators in order to generate the interstitial output values. A final embodiment of the invention combines two averaging flash ADCs to form a novel subranging ADC.

DETAILED DESCRIPTION FIG.
1 is a block diagram of a conventional flash-type ADC where an input signal IN is applied to a first input terminal of each of 2.
sup.
n -1 comparators 114a to 114z.
A second input terminal of each comparators is coupled to receive a respectively different reference value provided by a resistor ladder which includes first and second sources of reference potential (V+ and ground) and 2.
sup.
n-1 serially connected resistors 112a to 112z.
These resistors are desirably of equal value and are arranged as a voltage divider network such that the reference potential for any comparator is obtained from the junction of two of the resistors 112.
The comparators 114a to 114z amplify the difference between the input signal level and the reference level.
Their output signals are below a predetermined logic threshold whenever the input signal value is greater than the respective reference signal value and is above a logic threshold value whenever the input signal value is less than the respective reference signal value.
The output signals of these comparators are applied to respective latches 116a to 116z.
Each of these latches is responsive to a clock signal CK to store the instantaneous output state of its associated comparator 114a to 114z.
These stored values are applied to a decoder 118.
Decoder 118 which may be a conventional thermometer type decoder, or a priority encoder, generates an n-bit digital output value representing the position in the ladder network of the reference potential which is closest in value to the input signal potential.
That is to say, the number of the comparator highest in the chain which has a logic-high output signal, where the comparator coupled to ground by one reference resistor is number 1 and the comparator coupled to V+ is number 2.
sup.
-1.
For relatively large numbers of bits in the digital output value, this type of ADC may present significant loads to the input signal IN and may be subject to significant integral and differential linearity errors



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