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Method-of-measuring-chiral-parameters-of-a-chiral-material

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Method of measuring chiral parameters of a chiral material

Details

Inventors: Jaggard, Dwight L.; Engheta, Nader;
Assignee: The Trustees of the University of Penn. (PA)
Primary Examiner: Wimer; Michael C.
Assistant Examiner: Brown; Peter Toby
Attorney, Agent or Firm:

Methods of measuring chiral parameters of chiral materials with chiral antennas are provided. These methods involve the use of parallel electric and magnetic dipoles to construct a point sensor in conjunction with the use of a turnstyle antenna as a source. By exciting the chiral medium with the turnstyle antenna, both the absolute degree of chirality and the handedness of the chiral medium can be measured by varying the output currents of the point sensor until a null is achieved. This condition indictes that the ratio p/m, where p is the magnitude of the electric dipole moment and m is the magnitude of the magnetic dipole moment, of the point sensor is .+-.i/v.sub.c. From this relation and knowledge of the relation of permittivity and permeability, the absolute value of the chiral admittance and the chirality factor of the medium can also be found.

DETAILED DESCRIPTION Antennas comprising at least one antenna element, and chiral material in proximity to the antenna element wherein two electromagnetic modes are allowed, are provided in accordance with this invention.

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