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Home Radio PC-board-test-fixture

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 PC board test fixture

Details
Inventors: Hart, Tom;
Assignee: Testsystems, Inc. (Tempe, AZ)
Primary Examiner: Eisenzopf; Reinhard J.
Assistant Examiner: Baker; Stephen M.
Attorney, Agent or Firm: Cahill, Sutton & Thomas

A PC board test fixture translates various stimulation signals produced from a base grid of an automatic test system to randomly positioned test points of a printed circuit board to be tested. The test fixture includes a translator board having conductive pads aligned with probes of the base grid. Conductive pads on the top surface of the translator board are aligned with spring-loaded probes carried by a probe support fixture and aligned with the random test points of the printed circuit board. Conductive feedthroughs connect selected conductive pads on the bottom of the translator board to the randomly located pads on top of the translator board. A computer-executed algorithm compares the locations of the pads on the top and bottom of the translator board to determine the locations of the feedthroughs.

DETAILED DESCRIPTION It is an object of the invention to provide an inexpensive deterministic apparatus for translation of automatic PC board tester base grid signals to and from randomly positioned test point or conductors of a PC board under test.
It is another object of the invention to provide a deterministic base grid to test point translation device which is highly compatible with present vacuum fixturing technology for printed circuit board testers.
It is another object of the invention to provide an automated technique for manufacturing an apparatus for translating test signals between the base grid of an automatic tester and probe points of a PC board to be tested.
It is another object of the invention to provide an automated testing apparatus for translating electrical signals between a base grid conductor array having one density of signal concuctors to a printed circuit board having a higher density of conductive test areas.
It is another object of the invention to provide an improved probe pin assembly for use in automatic PC board test apparatus.
Briefly described, and in accordance with one embodiment thereof, the invention provides an apparatus and method for translating test signals from base grid conductors of an automatic test system to randomly positioned test points of a printed circuit board by providing vertical feedthroughs in a translator board having conductive pads on a bottom surface thereof precisely aligned with and adapted for contact to test signal conductors of the base grid, the translator board also having conductive pads on its upper surface precisely aligned with the randomly oriented test points of the PC board to be tested.
The translator board is fastened to the bottom of a probe pin support jig having holes precisely aligned with the conductive pads on the top surface of the translator board.
Spring-loaded dual plunger probe pins are retained in the holes in the pin support fixture by a lip on the lower end of a sleeve within which the spring-loaded plungers move



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