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Details
Inventors: Outsuka, Koremitsu; Kawasaki, Kazuyoshi; Tanaka, Yutaka;
Assignee: Mitsubishi Kasei Kobyo Kabushiki Kaisha (Tokyo, JA)
Primary Examiner: Tung; T.
Assistant Examiner:
Attorney, Agent or Firm: Oblon, Fisher, Spivak, McClelland & Maier

In apparatus for use in differential pulse anodic stripping voltammetry the period of the pulse voltage is selected to be in a range of from 16.7 to 400 milliseconds for the purpose of analyzing an extremely small quantity of metal ions at high speeds and at high sensitivities.

DETAILED DESCRIPTION It is an object of this invention to provide improved apparatus for use in DPASV having high sensitivities.
Another object of this invention is to provide novel apparatus capable of analyzing a minute quantity of components contained in a solution at high sensitivities and in a short time.
According to this invention, these and further objects can be accomplished by providing apparatus for use in differential pulse anodic stripping voltammetry of the class comprising an electrolytic cell provided with a working electrode and a counter electrode; a source of plating voltage, a source of sweeping stripping voltage and a source of pulse voltage for impressing plating voltage, stripping voltage and pulse voltage rspectively across said working electrode and said counter electrode; a current-voltage converter for converting the current flowing through the working electrode into voltage for producing two sample voltages; voltage holding means for holding said two sample voltages; and a differential amplifier for amplifying the difference between said two sample voltages held by said voltage holding means, characterized in that said source of pulse voltage is constructed to generate a pulse voltage having a period of from 16.
7 to 400 milliseconds.



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